7 September 2017 Front Matter: Volume 10334
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10334, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.
Beyerer and Puente León: Front Matter: Volume 10334

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Author(s), “Title of Paper,” in Automated Visual Inspection and Machine Vision II, edited by Jürgen Beyerer, Fernando Puente León, Proceedings of SPIE Vol. 10334 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510611139

ISBN: 9781510611146 (electronic)

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Alekhin, Artem A., 0R

Altmann, Bettina, 0A

Anisimov, Andrei G., 0G

Apel, Uwe, 04

Arbuzova, Evgeniia A., 0U

Artigas, Roger, 0C

Aulbach, Laura, 03

Bauer, Sebastian, 08

Bergmann, Stephan, 06

Bermudez, Carlos, 0C

Beyerer, Jürgen, 06

Bey-Temsamani, Abdellatif, 02

Cadevall, Cristina, 0C

Cai, Lei, 0K

Cao, Zhiguo, 0F, 0H

Chen, Ran, 0O

Cheng, Xu, 0O

Chertov, Aleksandr N., 0T, 0U

Czymmek, Vitali, 0P

Dachsbacher, Carsten, 06

Dantanarayana, Harshana G., 0D

Farsani, Raziyeh A., 04

Fuersattel, Peter, 0V

Glebov, Victor, 0E

Gorbunova, Elena V., 0T, 0U

Grelcke, Michael, 0P

Gronle, Marc, 05

Haist, Tobias, 05

Han, Liya, 0O

Holtorf, Tim, 0P

Huntley, Jonathan M., 0D

Hussmann, Stephan, 0P

Ibañez, Sergi, 0C

Irgenfried, Stephan, 06

Ivanov, Alexander N., 0L

Júlio, Eduardo, 07

Knoll, Florian J., 0P

Knyaz, V. A., 0Q

Koch, Alexander W., 03

Korotaev, Valery V., 0U

Krippner, Wolfgang, 08

Laguarta, Ferran, 0C

Lashmanov, Oleg, 0E

Li, Bo, 0K

Li, Ran, 0F

Li, Ruibo, 0H

Li, Zhongwei, 0O

Lu, Min, 03

Lv, Jing, 0M

Lv, Wen, 0I, 0K, 0M

Maier, Andreas, 0V

Matilla, Aitor, 0C

Minnigazimov, Ramil I., 0L

Mohammadikaji, Mahsa, 06

Molchanov, V. V., 0Q

Nizhegorodova, Ksenia V., 0L

Ompusunggu, Agusmian P., 02

Oramas, Jose, 02

Osten, Wolfgang, 05

Pape, Christian, 0A

Patra, Sayantani, 0X

Peretyagin, Vladimir S., 0U

Porokhin, Vyacheslav V., 0L

Pratiher, Sawon, 0X

Pratiher, Souvik, 0X

Puente León, Fernando, 08

Reithmeier, Eduard, 0A

Riess, Christian, 0V

Rozhkova, Natalia N., 0T

Sadovnichii, Roman V., 0T

Salazar Bloise, Félix, 03

Santos, Bruno O., 07

Schaller, Christian, 0V

Serikova, Mariya G., 0G

Shi, Yusheng, 0O

Sidyakin, S. V., 0J

Solovey, Alexey A., 0R

Sure, Thomas, 04

Trushkina, Anna V., 0G

Tuytelaars, Tinne, 02

Valença, Jonatas, 07

Vasilev, Aleksandr S., 0G

Vishnyakov, B. V., 0J, 0Q

Vishnyakova, O. V., 0Q

Vizilter, Y. V., 0Q

Wagner, Felix, 08

Wang, Lin, 0K

Wang, Shengjia, 03

Wörn, Heinz, 06

Xian, Ke, 0F

Xiao, Yang, 0F, 0H

Yang, Haiyue, 05

Ye, Qi, 0M

Yi, Jie, 0O

Zakirov, Anvar K., 0L

Zhan, Guomin, 0O

Zhang, Libao, 0I, 0K, 0M

Zhang, Qian, 0F, 0H

Zhang, Runze, 0H

Zhong, Kai, 0O

Zhu, Yongchun, 0I

Conference Committee

Symposium Chair

  • Wolfgang Osten, Universität Stuttgart (Germany)

Conference Chairs

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany) and Karlsruher Institut für Technologie (Germany)

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

Conference Programme Committee

  • Christian Frese, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Andreas Heinrich, Hochschule Aalen (Germany)

  • Michael Heizmann, Karlsruher Institut für Technologie (Germany)

  • Bernd Jähne, Ruprecht-Karls-Universität Heidelberg (Germany)

  • Thomas Längle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Markus Maurer, VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH (Germany)

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Felix Salazar, Universidad Politécnica de Madrid (Spain)

  • Robert Schmitt, Fraunhofer-Institut für Produktionstechnologie (Germany)

  • Hugo Thienpont, Vrije Universiteit Brussel (Belgium)

  • Stefan Werling, Duale Hochschule Baden-Würtemberg (Germany)

  • Ernst Wiedenmann, Serious Enterprises (Germany)

  • Volker Willert, Technische Universität Darmstadt (Germany)

Session Chairs

1 Image Acquisition

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

2 Simulation

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

3 Multispectral Inspection

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

4 Inspection, Monitoring, and Detection

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10334", Proc. SPIE 10334, Automated Visual Inspection and Machine Vision II, 1033401 (7 September 2017); doi: 10.1117/12.2284245; https://doi.org/10.1117/12.2284245
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