6 April 2017 Morphology and optical properties of thin CdTe films
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Proceedings Volume 10342, Optical Technologies for Telecommunications 2016; 103420V (2017) https://doi.org/10.1117/12.2270758
Event: XIV International Scientific and Technical Conference on Optical Technologies in Telecommunications, 2016, Samara, Russian Federation
Abstract
Experimental research in deposition of thin CdTe films was carried out using the resistive dynamic vacuum evaporation method. While forming thin CdTe films, temperature parameters of a substrate varied. Parameters of obtained CdTe films were investigated using Raman spectroscopy, scanning profilometry and scanning electron microscopy. The measured results showed high quality of thin CdTe films deposited on the substrate at temperature of 300°C and 450°C.
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V. V. Podlipnov, V. A. Kolpakov, "Morphology and optical properties of thin CdTe films", Proc. SPIE 10342, Optical Technologies for Telecommunications 2016, 103420V (6 April 2017); doi: 10.1117/12.2270758; https://doi.org/10.1117/12.2270758
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