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1 May 1989 Design Review Of A Complete Angle Scatter Instrument
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Proceedings Volume 1036, Precision Instrument Design; (1989)
Event: SPIE Advanced Processing Technologies for Optical and Electronic Devices (colocated wth OPTCON), 1988, Santa Clara, CA, United States
An instrument has been designed and built to measure plane of incidence scatter at multiple wavelengths including .6328μm, from reflective, transmissive, specular, diffuse, flat and curved optics. An extensive software package accompanies the instrument and is used both to control the measurement process and to analyze the measurement data. Techniques employed in the design and development of this instrument are described. An error analysis for the measured BSDF is provided and calibration of the instrument is discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Rifkin, K. A. Klicker, D. R. Bjork, D. R. Cheever, T. F. Schiff, J. C. Stover, F. M. Cady, D. J. Wilson, P. D. Chausse, and K. H. Kirchner "Design Review Of A Complete Angle Scatter Instrument", Proc. SPIE 1036, Precision Instrument Design, (1 May 1989);

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