1 May 1989 Precision Lens Mounting Monitored By Interfering Beams
Author Affiliations +
Proceedings Volume 1036, Precision Instrument Design; (1989) https://doi.org/10.1117/12.950960
Event: SPIE Advanced Processing Technologies for Optical and Electronic Devices (colocated wth OPTCON), 1988, Santa Clara, CA, United States
Abstract
A two-beams interference technique developed to test the wedge of a lens (Ref. 1) has been applied to precision mounting of optical systems. When an optical system requires very high centration and tolerates very little tilt for each of its optical elements, one way of achieving that goal is to mount each individual lens well-aligned in a sub-cell, and the sub-cells are made press-fit to the main lens housing. The main housing and sub-cells are made with high mechanical precision. A twelve lenses optical system for a laser scanner has been assembled that way, the whole optical system achieves diffraction limited quality.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Philip Lam, "Precision Lens Mounting Monitored By Interfering Beams", Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); doi: 10.1117/12.950960; https://doi.org/10.1117/12.950960
PROCEEDINGS
1 PAGES


SHARE
Back to Top