1 May 1989 Prototype Development Of A Microcontroller Based Field Optical Density Tester
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Proceedings Volume 1036, Precision Instrument Design; (1989) https://doi.org/10.1117/12.950994
Event: SPIE Advanced Processing Technologies for Optical and Electronic Devices (colocated wth OPTCON), 1988, Santa Clara, CA, United States
A portable spectrometer has been designed that measures the transmission of tank periscopes in the field. The purpose of the instrument is to measure optical density to 4.0 over the range from 380 to 1100nm with lnm resolution. A motorized monochromator scans the desired test band. Data is acquired by silicon photodiodes, amplified by a programmable gain amplifier (PGA) and processed using a 12-bit A/D converter. A chopped input beam removes background signal. Ratio detection between measurement and reference arms compensates for input light intensity variation. Innovations in optical, mechanical and signal processing design are described. The precision of measurements made at various wavelengths and angles of incidence is discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel R. Cote, Daniel R. Cote, L. David LaFleur, L. David LaFleur, Victor E. Cappelli, Victor E. Cappelli, Robert H. Clayton, Robert H. Clayton, Kenneth J. Bingman, Kenneth J. Bingman, } "Prototype Development Of A Microcontroller Based Field Optical Density Tester", Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); doi: 10.1117/12.950994; https://doi.org/10.1117/12.950994

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