22 November 2017 Front Matter: Volume 10377
This PDF file contains the front matter associated with SPIE Proceedings Volume 10377, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optical System Alignment, Tolerancing, and Verification XI, edited by José Sasián, Richard N. Youngworth, Proceedings of SPIE Vol. 10377 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510612112

ISBN: 9781510612129 (electronic)

Published by


P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445


Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.


Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Andre, James E., 0J

Armani, Nerses, 0E

Bagdanove, Paul, 0H

Balonek, Gregory, 0J

Barbieri, Giancarlo, 06

Bartusek, Lisa, 0E

Belenguer, T., 0O

Berrier, Joshua, 0H, 0I

Brown, Joshua J., 0J

Buss, Christian, 02

Canchal, R., 0O

Canora, C. P., 0O

Casey, Tom, 0E

Chesbrough, Christian D., 0J

Cho, Sungwhi, 0L

Choi, Heejoo, 0G

Chrisp, Michael P., 0J

Chu, Jiyoung, 0L

Clark, Kristin E., 0J

Clarke, Steven A., 04

Cofie, Emmanuel, 0H

Content, Dave, 0E

Conturie, Yves, 0E

Dalpiaz, Michael, 0J

Dubin, Matthew, 0G

Eichhorn, William, 0I

Escribano, D., 0O

Fensin, Saryu J., 04

Fornaroli, C., 0K

Frayer, Daniel K., 04

Gao, Guangjun, 0E

Gillner, A., 0K

Glassman, Tiffany, 0H

Gordillo, C., 0O

Gross, Herbert, 0A

Gum, Jeff, 0I

Hadjimichael, Theodore, 0H, 0I

Hagopian, John, 0E

Hayden, Joseph, 0I

Ho, Cheng-Fang, 0M

Holtkamp, J., 0K

Hsu, Wei-Yao, 0M

Jang, Sangdon, 0L

Johnson, Eric, 0H

Jones, David R., 04

Joo, Won Don, 0L

Jurling, Alden, 0E

Kaplan, Natan, 0K

Kaufman, Morris I., 04

Khreishi, Manal, 0I

Kim, Dae Wook, 0G

Krisiloff, Allen J., 09

Kuhn, William P., 0C

Kumler, James J., 02

Lennon, Joseph, 0J

Levi, Joshua, 0H

Liu, Qing, 06

Lo, Amy, 0H

Lopez-Reyes, G., 0O

Malone, Robert M., 04

Marx, Cathy, 0E

Marzouk, Joe, 0E

McGillivray, Kevin D., 04

McLean, Kyle, 0H, 0I

McMann, Joseph, 0H

Moral, A. G., 0O

Ohl, Raymond G., 0H, 0I

Oleszko, Mateusz, 0A

Osgood, Dean, 0H

Ottevaere, Heidi, 06

Parker, James, 0H

Parks, Robert E., 0B

Pasquale, Bert, 0E

Peng, Wei-Jei, 0M

Prieto, J. A. R., 0O

Ramos, G., 0O

Redman, Kevin, 0H, 0I

Richards, B. C., 0J

Roberts, Vicki, 0H

Rull, F., 0O

Ryu, Jieun, 03

Sanson, Mark C., 07

Santiago, A., 0O

Sanz-Palomino, M., 0O

Sasian, Jose, 03

Schwiegerling, Jim, 0D

Shachaf, Lior, 0K

Smith, J. Scott, 0E

Stephens, Matthew, 0H

Sullivan, Joseph, 0I

Sutton, Adam, 0H

Tamkin, John M., 0F

Tang, Hong, 0E

Thienpont, Hugo, 06

Trumper, Isaac, 0G

Wenzel, Greg, 0H, 0I

Whipple, Arthur, 0E

Williamson, Ray, 08

Young, Jerrod, 0H, 0I

Zhao, Wenchuan, 0G

Zibner, F., 0K

Conference Committee

Program Track Chair

  • José Sasián, College of Optical Sciences, The University of Arizona (United States)

Conference Chairs

  • José Sasián, College of Optical Sciences, The University of Arizona (United States)

    Richard N. Youngworth, Riyo LLC (United States)

Conference Program Committee

  • Matthew B. Dubin, College of Optical Sciences, The University of Arizona (United States)

    Jonathan D. Ellis, University of Rochester (United States)

    Sen Han, University of Shanghai for Science and Technology (China)

    Marco Hanft, Carl Zeiss AG (Germany)

    William P. Kuhn, Opt-E (United States)

    Chao-Wen Liang, National Central University (Taiwan)

    Norbert Lindlein, Friedrich-Alexander-Universität Erlangen-Nürnberg (Germany)

    Robert M. Malone, National Security Technologies, LLC (United States)

    Raymond G. Ohl IV, NASA Goddard Space Flight Center (United States)

    Craig W. Pansing, Synopsys, Inc. (United States)

    Robert E. Parks, Optical Perspectives Group, LLC (United States)

    Brian C. Primeau, Ball Aerospace & Technologies Corporation (United States)

    Martha Rosete-Aguilar, Universidad Nacional Autónoma de México (Mexico)

    Peng Su, ASML US, Inc. (United States)

    Yana Z. Williams, Atlas Material Testing Technology (United States)

Session Chairs

  • 1 Verification and System Alignment

    Brian C. Primeau, Ball Aerospace & Technologies Corporation (United States)

  • 2 Optical Tolerancing

    William P. Kuhn, Opt-E (United States)

  • 3 Alignment of Optical Systems I

    Robert M. Malone, National Security Technologies, LLC (United States)

  • 4 Alignment of Optical Systems II

    Robert E. Parks, Optical Perspectives Group, LLC (United States)


The San Diego SPIE Optics and Photonics Symposium has provided a beautiful setting for a world-class conference for Optical System Alignment, Tolerancing, and Verification XI. As chairs of this conference, we are continually pleased with the technical content, authors, program committee, and SPIE. We find it difficult to express how thankful and humbled we are, by the community’s and SPIE’s support of a conference that embodies the traits of an international event. The 2017 conference had four sessions with excellent talks, in addition to some posters presented at the poster session. Of special note is that all presenters successfully submitted proceedings papers, for a total of 21 in the volume. Having 100% manuscript submission is excellent and this provides the community at large the technical content of the conference.

This year there were many highlights in the conference and we encourage the community to peruse the proceedings. We had a high value first session covering papers in alignment and verification topics. The second session involved a strong set of papers primarily covering tolerancing of optical systems, including coverage of two key international standards in the ISO 10110 drawing series. The sessions in the afternoon were both excellent, with papers on aligning optical systems, entailing not just alignment of specific systems but also methodology and hardware for aligning optical systems. The invited paper on Zernike polynomials and alignment was valuable, especially as it is useful to different fields including visual optics. The poster session was well attended and covered alignment of optical systems.

This conference will continue in 2018. We encourage everyone interested in optical system alignment, tolerancing, and verification to look for the call for papers and submit their work early 2018. Please feel free to contact us, or anyone in our program committee, for questions, requests or comments.

See you in San Diego in August 2018.

José Sasián Richard N. Youngworth

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10377", Proc. SPIE 10377, Optical System Alignment, Tolerancing, and Verification XI, 1037701 (22 November 2017); doi: 10.1117/12.2296904; https://doi.org/10.1117/12.2296904

Back to Top