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5 July 1989 Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region
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Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951087
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel
Abstract
An absolute reflectometer for the 0.8-5.5μm region is described. It is based on integrating spheres, and utilizes the Third Taylor method in the 7°/d configuration. A new theory for the reduction of the data is presented, and results for some diffuse gold samples are given.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Sheffer "Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951087
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