Paper
5 July 1989 Focus Sensing Optical Profilometer
Andrei Brunfeld, Joseph Shamir, Gregory Toker
Author Affiliations +
Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951051
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel
Abstract
A high sensitivity focus sensing configuration is employed in the construction of an accurate optical profilometer. The system is analyzed theoretically and experimental investigation indicates a sensitivity better than 3nm with a linear dynamic range of 50μm. The deteriorating effects of finite apertures and various misalignments are also considered and taken into account for improved measuring procedures.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei Brunfeld, Joseph Shamir, and Gregory Toker "Focus Sensing Optical Profilometer", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951051
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KEYWORDS
Sensors

Gaussian beams

Spatial filters

Optical engineering

Profilometers

Beam propagation method

Calibration

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