Paper
5 July 1989 Surface Emissivity Determination Of Diffuse Objects In Natural Surroundings - SEFAB Technique
L. S. Balfour, A. Ben-Shalom
Author Affiliations +
Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951086
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel
Abstract
An important parameter in the analysis of thermal infrared signatures is the object surface emissivity. An in-situ determination of the emissivity of diffuse objects, both natural and artificial, in the field is most desirable. In this paper we present a technique that may be employed to determine emissivities in the infrared region using a commercial thermal imager. The Surface Emissivity For Ambient Background (SEFAB) technique uses two reference surfaces of known emissivities to determine the emissivity of the desired object. The two main advantages of the present technique are: 1) The camera calibration constant is not required and 2) The individual surface temperatures are not required provided they are the same for all the surfaces during the measurement.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. S. Balfour and A. Ben-Shalom "Surface Emissivity Determination Of Diffuse Objects In Natural Surroundings - SEFAB Technique", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951086
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KEYWORDS
Thermography

Copper

Cameras

Aluminum

Optical engineering

Reflectivity

Imaging systems

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