5 July 1989 The Application Of Thin Films Technique To Compensate Polarization Effects On Total Internal Reflection
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Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989); doi: 10.1117/12.951070
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel
Abstract
On total internal reflection (TIR) different phase shifts occur to the p- and s- states of polarization. Therefore the polarization state of the reflected light on TIR is generally elliptical polarized and differs from the state of polarization of the incoming wave. Only in cases where the entering wave has a pure p-or s- state relative to the plane of incidence these polarization states of the reflected wave are unchanged and hence are eigen-states. In optical systems where the optical path is folded via TIR by using prisms, corner-cubes, retro-prisms, etc., the state of polarization of the exit wave will usually differ from the incoming one. In cases where the polarization state should be conserved, correcting retardation elements are applied to compensate the polarization effects on TIR. Instead of these bulk correcting elements, multilayer dielectric thin films stacks could be applied on the desired surfaces. This technique is introduced and discussed. An illustration of this method is represented on a retro - roof - prism of the type 45°-60° -60°.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Rabinovitch, "The Application Of Thin Films Technique To Compensate Polarization Effects On Total Internal Reflection", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); doi: 10.1117/12.951070; https://doi.org/10.1117/12.951070
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KEYWORDS
Dielectric polarization

Thin films

Wave plates

Polarization

Dielectrics

Phase shifts

Optical engineering

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