Moire Deflectometry - Applications To Lens Analysis

Kathi Kreske; Eliezer Keren; Oded Kafri

doi:10.1117/12.951037

5 July 1989 Moire Deflectometry - Applications To Lens Analysis

Kathi Kreske, Eliezer Keren, Oded Kafri

Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951037
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel

Abstract

Moire deflectometry, a method for ray deflection mapping, is described. Its use in lens testing for determining properties such as surface microstructure, radius of curvature, thickness, aberrations, and OTF (optical transfer function), is demonstrated. Unlike interferometry, moire deflectometry is a ray tracing technique, and therefore the analysis of three dimensional objects is greatly simplified. Although the ray tracing approach to optical systems is much older than wave theory, moire deflectometry seems to be the first attempt to apply ray tracing methods systematically to optical metrology. The technique is fully quantitative, interferometry compatible in accuracy, and has the additional advantage of tunable sensitivity.

Citation Download Citation

Kathi Kreske, Eliezer Keren, and Oded Kafri "Moire Deflectometry - Applications To Lens Analysis", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951037

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