23 August 2017 Phase-shifting projected fringe profilometry using ternary-encoded patterns
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Abstract
A fringe projection profilometry is presented. It uses the phase-shifting technique perform the phase-extraction and use the ternary-encoded patterns to identify the fringe orders. Only five-shot measurements are required for data processing. Experiments show that absolute phases could be obtained with high reliability.
Conference Presentation
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Sih-Yue Chen, Sih-Yue Chen, Nai-Jen Cheng, Nai-Jen Cheng, Wei-Hung Su, Wei-Hung Su, } "Phase-shifting projected fringe profilometry using ternary-encoded patterns", Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820U (23 August 2017); doi: 10.1117/12.2275325; https://doi.org/10.1117/12.2275325
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