25 October 2017 Front matter: Volume 10385
This PDF file contains the front matter associated with SPIE Proceedings Volume 10385, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in Advances in Metrology for X-Ray and EUV Optics VII, edited by Lahsen Assoufid, Haruhiko Ohashi, Anand Khrishna Asundi, Proceedings of SPIE Vol. 10385 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510612273

ISBN: 9781510612280 (electronic)

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abbamonte, Peter, 06

Adam, Jérôme, 0G

Assoufid, Lahsen, 02, 08

Barrett, Raymond, 0N

Bean, Sunil, 08

Byrum, Taylor, 06

Centers, Gary P., 0G, 0H

da Silva, Murilo B., 0C

Dvorak, Joseph, 06, 08

Egawa, S., 0O

Eggenstein, F., 05

Freijo-Martin, I., 07

Geckeler, Ralf D., 0A

Gevorkyan, Gevork S., 0G, 0H, 0I

Gleason, Samuel, 06

Grizolli, Walan, 02

Guertin, Christian F., 0A

Huang, Qiushi, 0M

Jarrige, Ignace, 06

Jensen, Cody, 06

Jiang, Hui, 0Q

Jiang, Lingyun, 06

Kashyap, Yogesh, 04

Kolodziej, Tomasz, 02

Krivenkov, M., 05

Kume, T., 0O

Lacey, Ian, 0G, 0H, 0I

Li, Aiguo, 0M, 0Q

Liang, Dongxu, 0Q

Manton, Jonathan, 06, 08

McKinney, Wayne R., 0I

Meyer, Bernd C., 0C

Mimura, H., 0O

Motoyama, H., 0O

Nikitin, Sergey M., 0G, 0H, 0I

Polonska, Kateryna S., 0H

Qian, Jun, 08

Rudolph, I., 05

Sawhney, Kawal, 04

Schäfers, F., 05

Sertsu, M. G., 05

Sheung, Janet, 06, 08

Shi, Xianbo, 02

Shi, Yingna, 0M

Shvyd’ko, Yuri, 02

Smith, Brian V., 0G

Sokolov, A., 05

Sullivan, Joseph, 08

Takacs, Peter Z., 08, 0I

Takei, Y., 0O

Thomasset, Muriel, 08

Tian, Naxi, 0Q

Vannoni, M., 07

Varykhalov, A., 05

Vivo, Amparo, 0N

Wang, Hongchang, 04

Wang, Hua, 0M, 0Q

Wang, Zhanshan, 0M

Wolf, J., 05

Xu, Xudong, 0M

Yamaguchi, G., 0O

Yan, Shuai, 0Q

Yandayan, Tanfer, 09, 0B

Yashchuk, Valeriy V., 0G, 0H, 0I

Zeschke, T., 05

Zhang, Ling, 0M

Zhou, Tunhe, 04

Conference Committee

Conference Chairs

  • Lahsen Assoufid, Argonne National Laboratory (United States)

  • Haruhiko Ohashi, Japan Synchrotron Radiation Research Institute (Japan)

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

Program Track Chairs

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

  • Ralph B. James, Savannah River National Laboratory (United States)

Conference Program Committee

  • Simon G. Alcock, Diamond Light Source Ltd. (United Kingdom)

  • Raymond Barrett, European Synchrotron Radiation Facility (France)

  • Daniele Cocco, SLAC National Accelerator Laboratory (United States)

  • Uwe Flechsig, Paul Scherrer Institut (Switzerland)

  • Ralf D. Geckeler, Physikalisch-Technische Bundesanstalt (Germany)

  • Kenneth A. Goldberg, Lawrence Berkeley National Laboratory (United States)

  • Mikhail V. Gubarev, NASA Marshall Space Flight Center (United States)

  • Christian F. Guertin, Vermont Photonics Technologies Corporation (United States)

  • Mourad Idir, Brookhaven National Laboratory (United States)

  • Weiguo Liu, Xi’an Technological University (China)

  • Jonathan Manton, Inprentus, Inc. (United States)

  • Hidekazu Mimura, The University of Tokyo (Japan)

  • Josep Nicolas, CELLS - ALBA (Spain)

  • Lorenzo Raimondi, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • Rajdeep Singh Rawat, National Institute of Education (Singapore)

  • Kawal Sawhney, Diamond Light Source Ltd. (United Kingdom)

  • Frank Siewert, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)

  • Regina Soufli, Lawrence Livermore National Laboratory (United States)

  • Daniele Spiga, INAF - Osservatorio Astronomico di Brera (Italy)

  • Peter Z. Takacs, Brookhaven National Laboratory (United States)

  • Muriel Thomasset, Synchrotron SOLEIL (France)

  • Maurizio Vannoni, European XFEL GmbH (Germany)

  • Amparo Vivo, European Synchrotron Radiation Facility (France)

  • Zhanshan Wang, Tongji University (China)

  • Kazuto Yamauchi, Osaka University (Japan)

  • Tanfer Yandayan, TUBITAK UME (Turkey)

  • Valeriy V. Yashchuk, Lawrence Berkeley National Laboratory (United States)

  • Brian W. Yates, Canadian Light Source Inc. (Canada)

Session Chairs

  • 1 At-Wavelength Metrology

    Lahsen Assoufid, Argonne National Laboratory (United States)

  • 2 Metrology of VLS Gratings

    Kazuto Yamauchi, Osaka University (Japan)

  • 3 Calibration and Nanoradian Metrology

    Lahsen Assoufid, Argonne National Laboratory (United States)

  • 4 Metrology Facilities

    Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • 5 Novel Instruments and Methods

    Kazuto Yamauchi, Osaka University (Japan)

  • 6 Stitching and Sub-Nanometer Surface Metrology

    Kazuto Yamauchi, Osaka University (Japan)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front matter: Volume 10385", Proc. SPIE 10385, Advances in Metrology for X-Ray and EUV Optics VII, 1038501 (25 October 2017); doi: 10.1117/12.2297021; https://doi.org/10.1117/12.2297021

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