7 September 2017 Single-grating Talbot imaging for wavefront sensing and x-ray metrology
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Single-grating Talbot imaging relies on high-spatial-resolution detectors to perform accurate measurements of X-ray beam wavefronts. The wavefront can be retrieved with a single image, and a typical measurement and data analysis can be performed in few seconds. These qualities make it an ideal tool for synchrotron beamline diagnostics and in-situ metrology. The wavefront measurement can be used both to obtain a phase contrast image of an object and to characterize an X-ray beam. In this work, we explore the concept in two cases: at-wavelength metrology of 2D parabolic beryllium lenses and a wavefront sensor using a diamond crystal beam splitter.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Walan Grizolli, Walan Grizolli, Xianbo Shi, Xianbo Shi, Tomasz Kolodziej, Tomasz Kolodziej, Yuri Shvyd'ko, Yuri Shvyd'ko, Lahsen Assoufid, Lahsen Assoufid, } "Single-grating Talbot imaging for wavefront sensing and x-ray metrology", Proc. SPIE 10385, Advances in Metrology for X-Ray and EUV Optics VII, 1038502 (7 September 2017); doi: 10.1117/12.2274023; https://doi.org/10.1117/12.2274023


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