9 November 2017 Front Matter: Volume 10386
This PDF file contains the front matter associated with SPIE Proceedings Volume 10386, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components XII, edited by Christian Morawe, Ali M. Khounsary, Shunji Goto, Proceedings of SPIE Vol. 10386 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510612297

ISBN: 9781510612303 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Akan, Rabia, 0S

Bhartiya, S., 05

Boesenberg, Ulrike, 0A

Cao, Leifeng, 0Q

Carau, Damien, 03, 0V

Chen, Pice, 0M, 0Z

Chen, Sharon, 0D

Cheng, Jinming, 04

Cheng, Xianchao, 04

Cordier, Mark, 0D

Dhamgaye, Vishal, 0B

Dhawan, R., 05

Eberl, Christian, 08

Fabris, Nicola, 0R

Falkenberg, Gerald, 0A

Frassetto, Fabio, 0R

Galtier, Eric C., 0A

Gao, Ya, 0M

Garrevoet, Jan, 0A

Giakoumidis, Stylianos, 0A, 0S

Gome, A., 05

Goto, Takumi, 0E

Hashizume, Hirokazu, 0E

Ishikawa, Shin-nosuke, 0E

Ishikawa, Tetsuya, 0C

Jung, Il Woong, 0M, 0Z

Kime, Ayumi, 0E

Kohmura, Yoshiki, 0C, 0E

Koyama, Takahisa, 09

Krebs, Hans-Ulrich, 08

Lau, S. H., 0D

Laundy, David, 0B

Lee, Hae Ja, 0A

Lewis, Sylvia J. Y., 0D

Li, Hailiang, 0Q

Li, Zhilong, 0M

Liu, Dongbing, 04

Lopez, Daniel, 0M, 0Z

Lum, P., 07

Lyon, Alan, 0D

Maezawa, Tadakazu, 0E

Majhi, A., 05

Matsuyama, Satoshi, 0C, 0E

Mimura, Hidekazu, 09

Miotti, Paolo, 0R

Miyake, Akira, 0E

Morawe, Christian, 03, 0V

Motoyama, Hiroto, 09

Mu, Jian, 04

Nagler, Bob, 0A

Narukage, Noriyuki, 0E

Nayak, M., 05

Nolte, Stefan, 0A

Ohashi, Haruhiko, 09

Osterhoff, Markus, 08

Owada, Shigeki, 09

Padmore, H. A., 07

Pape, Ian, 0B

Parfeniukas, Karolis, 0A, 0S

Peffen, Jean-Christophe, 03, 0V

Poletto, Luca, 0R

Pradhan, P. C., 05

Rahomäki, Jussi, 0A

Rai, S. K., 05

Rau, Christoph, 0A

Reddy, V. R., 05

Reynolds, David, 0D

Rödel, Christian, 0A

Sahoo, P. K., 05

Sakao, Taro, 0E

Sano, Yasuhisa, 0C

Sawhney, Kawal, 0B

Scholz, Maria, 0A

Schroer, Christian G., 0A

Schropp, Andreas, 0A

Schwartz, C. P., 0Z

Seiboth, Frank, 0A

Semenov, Vladimir A., 0D

Seshadri, Srivatsan, 0D

Shenoy, Gopal K., 0M, 0Z

Singh, A., 05

Soltau, Jakob, 08

Spink, Richard I., 0D

Stripe, Benjamin, 0D

Suematsu, Yoshinori, 0E

Tan, Bozhong, 04

Tono, Kensuke, 09

Turchini, Stefano, 0R

Ullsperger, Tobias, 0A

Vogt, Ulrich, 0A, 0S

Voronov, D. L., 07

Wagner, Ulrich, 0A

Walko, Donald A., 0M, 0Z

Wang, Jin, 0M, 0Z

Wei, Lai, 0Q

Wittwer, Felix, 0A

Wünsche, Martin, 0A

Xie, Changqing, 0Q

Yabashi, Makina, 09, 0C

Yamada, Jumpei, 0C, 0E

Yamauchi, Kazuto, 0C, 0E

Yang, Qingguo, 04

Yasuda, Shuhei, 0C, 0E

Yun, Wenbing, 0D

Zhu, Xiaoli, 0Q

Zuppella, Paola, 0R

Conference Committee

Conference Chairs

  • Christian Morawe, ESRF - The European Synchrotron (France)

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

  • Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

Program Track Chair

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

Conference Program Committee

  • Lucia Alianelli, Diamond Light Source Ltd. (United Kingdom)

  • Lahsen Assoufid, Argonne National Laboratory (United States)

  • Stefan Braun, Fraunhofer IWS Dresden (Germany)

  • Shih-Lin Chang, National Tsing Hua University (Taiwan)

  • Daniele Cocco, SLAC National Accelerator Laboratory (United States)

  • Raymond Conley Jr., Argonne National Laboratory (United States)

  • Sultan B. Dabagov, Istituto Nazionale di Fisica Nucleare (Italy)

  • Christian David, Paul Scherrer Institut (Switzerland)

  • Hans M. Hertz, KTH Royal Institute of Technology (Sweden)

  • Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • George A. Kyrala, Los Alamos National Laboratory (United States)

  • Eric Louis, MESA+ Institute for Nanotechnology (Netherlands)

  • Carolyn A. MacDonald, University at Albany (United States)

  • Hidekazu Mimura, The University of Tokyo (Japan)

  • Howard A. Padmore, Lawrence Berkeley National Laboratory (United States)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

  • Yuriy Ya Platonov, Rigaku Innovative Technologies, Inc. (United States)

  • Seungyu Rah, Pohang University of Science and Technology (Korea, Republic of)

  • Peter Revesz, Cornell University (United States)

  • Horst Schulte-Schrepping, Deutsches Elektronen-Synchrotron (Germany)

  • Regina Soufli, Lawrence Livermore National Laboratory (United States)

  • Daniele Spiga, INAF - Osservatorio Astronomico di Brera (Italy)

  • Stanislav Stoupin, Cornell University (United States)

  • Mau-Tsu Tang, National Synchrotron Radiation Research Center (Taiwan)

  • Akihiko Ueda, JTEC Corporation (Japan)

  • Zhanshan Wang, Tongji University (China)

  • Joerg Wiesmann, Incoatec GmbH (Germany)

  • Makina Yabashi, RIKEN (Japan) and Japan Synchrotron Radiation Research Institute (Japan)

  • Kazuto Yamauchi, Osaka University (Japan)

  • Brian W. Yates, Canadian Light Source Inc. (Canada)

Session Chairs

  • 1 Multilayers

    Lahsen Assoufid, Argonne National Laboratory (United States)

  • 2 Focusing

    Christian Morawe, ESRF - The European Synchrotron (France)

    Kazuto Yamauchi, Osaka University (Japan)

  • 3 Mirrors

    Ali M. Khounsary, Illinois Institute of Technology (United States)

  • 4 Beamlines and Facilities

    Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

  • 5 Opto-Thermomechanics

    Markus Osterhoff, Georg-August-Univ. Göttingen (Germany)

    Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • 6 Crystals

    Christian Morawe, ESRF - The European Synchrotron (France)

    Stanislav Stoupin, Cornell University (United States)

  • 7 Gratings

    Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

    Daniele Spiga, INAF - Osservatorio Astronomico di Brera (Italy)


This volume contains papers presented at the conference on Advances in XRay/EUV Optics and Components XII, held 8–9 August 2017 in San Diego, California, USA, as part of the 2017 SPIE Optics + Photonics symposium.

The conference was composed of seven oral sessions: Multilayers, Focusing, Mirrors, Beamlines and Facilities, Opto-Thermomechanics, Crystals, and Gratings. The focus of the conference was on technological developments in X-ray/EUV optics, covering a wide spectral range. Topics related to metrology, laboratory-based xray sources, computational methods for x-ray optics, and x-ray nanoimaging were presented in independent conferences at the same symposium.

Scheduled for one and half days of oral presentations, and accompanied by an evening poster session, the conference highlighted recent developments in the field and stimulated lively discussions among participants.

We would like to thank the authors, speakers, session chairs, programme committee members, and the conference participants for their contributions, and the SPIE staff for their help in the organization of the conference.

Christian Morawe

Ali M. Khounsary

Shunji Goto

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10386", Proc. SPIE 10386, Advances in X-Ray/EUV Optics and Components XII, 1038601 (9 November 2017); doi: 10.1117/12.2295743; https://doi.org/10.1117/12.2295743

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