23 August 2017 A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography
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Proceedings Volume 10388, Advances in Computational Methods for X-Ray Optics IV; 103880P (2017); doi: 10.1117/12.2273763
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States
Abstract
In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples. An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g. X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100). We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).
Conference Presentation
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Matteo Busi, Ulrik L. Olsen, Erik B. Knudsen, Jeppe R. Frisvad, Jan Kehres, Erik D. Christensen, Mohamad Khalil, Kristoffer Haldrup, "A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography", Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 103880P (23 August 2017); doi: 10.1117/12.2273763; http://dx.doi.org/10.1117/12.2273763
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KEYWORDS
Monte Carlo methods

X-rays

Device simulation

Scattering

Absorption

Collimation

Sensors

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