PyXRF: Python-based X-ray fluorescence analysis package

Li Li; Hanfei Yan; Wei Xu; Dantong Yu; Annie Heroux; Wah-Keat Lee; Stuart I. Campbell; Yong S. Chu

doi:10.1117/12.2272585

7 September 2017 PyXRF: Python-based X-ray fluorescence analysis package

Li Li, Hanfei Yan, Wei Xu, Dantong Yu, Annie Heroux, Wah-Keat Lee, Stuart I. Campbell, Yong S. Chu

Proceedings Volume 10389, X-Ray Nanoimaging: Instruments and Methods III; 103890U (2017) https://doi.org/10.1117/12.2272585
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

We developed a python-based fluorescence analysis package (PyXRF) at the National Synchrotron Light Source II (NSLS-II) for the X-ray fluorescence-microscopy beamlines, including Hard X-ray Nanoprobe (HXN), and Submicron Resolution X-ray Spectroscopy (SRX). This package contains a high-level fitting engine, a comprehensive commandline/ GUI design, rigorous physics calculations, and a visualization interface. PyXRF offers a method of automatically finding elements, so that users do not need to spend extra time selecting elements manually. Moreover, PyXRF provides a convenient and interactive way of adjusting fitting parameters with physical constraints. This will help us perform quantitative analysis, and find an appropriate initial guess for fitting. Furthermore, we also create an advanced mode for expert users to construct their own fitting strategies with a full control of each fitting parameter. PyXRF runs single-pixel fitting at a fast speed, which opens up the possibilities of viewing the results of fitting in real time during experiments. A convenient I/O interface was designed to obtain data directly from NSLS-II’s experimental database. PyXRF is under open-source development and designed to be an integral part of NSLS-II’s scientific computation library.

Citation Download Citation

Li Li, Hanfei Yan, Wei Xu, Dantong Yu, Annie Heroux, Wah-Keat Lee, Stuart I. Campbell, and Yong S. Chu "PyXRF: Python-based X-ray fluorescence analysis package", Proc. SPIE 10389, X-Ray Nanoimaging: Instruments and Methods III, 103890U (7 September 2017); https://doi.org/10.1117/12.2272585

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