18 November 1989 A Universal Test Fixture For Characterizing MM-Wave Solid State Devices Using A Novel Deembedding Procedure
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Proceedings Volume 1039, 13th Intl Conf on Infrared and Millimeter Waves; (1989) https://doi.org/10.1117/12.978455
Event: 13th International Conference on Infrared and Millimeter Waves, 1987, Honolulu, HI, United States
Abstract
The design and evaluation of a novel fixturing technique for characterizing mm-wave solid state devices, including monolithic microwave integrated circuits, is presented. The technique utilizes a cosine tapered ridge guide fixture and a one-tier deembedding procedure to provide accurate and repeatable device level data. Advanced features include "nondestructive" testing, full waveguide bandwidth operation, a high degree of universalism, and rapid yet repeatable chip-level characterization. Furthermore, only one set of calibration standards is required regardless of device geometry.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert R. Romanofsky, Robert R. Romanofsky, Kurt A. Shalkhauser, Kurt A. Shalkhauser, } "A Universal Test Fixture For Characterizing MM-Wave Solid State Devices Using A Novel Deembedding Procedure", Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978455; https://doi.org/10.1117/12.978455
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