7 September 2017 Investigation of a high-sensitivity near-infrared-ray computed tomography scanner
Author Affiliations +
In the near-infrared-ray computed tomography (NIR-CT) scanner, NIR rays are produced from a light-emitting diode (LED) and detected using a phototransistor (PT) and an infrared filter. The LED-peak wavelength is 850 nm, and 850- nm-peak NIRs are detected using the filtrated PD. The photocurrents flowing through the PT are converted into voltages using an emitter-follower circuit, and the output voltages are sent to a personal computer through an analog-digital converter. The NIR projection curves for tomography are obtained by repeated translations and rotations of the object, and the translating is conducted in both directions of its movement. The 850-nm NIRs easily penetrated living bodies, and the NIR-CT was performed with changes in the sensitivity at relative sensitivities of 1 and 21.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eiichi Sato, Eiichi Sato, Yasuyuki Oda, Yasuyuki Oda, Sohei Yoshida, Sohei Yoshida, Satoshi Yamaguchi, Satoshi Yamaguchi, Yuichi Sato, Yuichi Sato, Osahiko Hagiwara, Osahiko Hagiwara, Tomotaka Ishii, Tomotaka Ishii, Hiroshi Matsukiyo, Hiroshi Matsukiyo, Toshiyuki Enomoto, Toshiyuki Enomoto, Manabu Watanabe, Manabu Watanabe, Shinya Kusachi, Shinya Kusachi, } "Investigation of a high-sensitivity near-infrared-ray computed tomography scanner", Proc. SPIE 10393, Radiation Detectors in Medicine, Industry, and National Security XVIII, 103930U (7 September 2017); doi: 10.1117/12.2275290; https://doi.org/10.1117/12.2275290


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