21 July 2017 A cascade method for TFT-LCD defect detection
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Proceedings Volume 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017); 104200T (2017) https://doi.org/10.1117/12.2282190
Event: Ninth International Conference on Digital Image Processing (ICDIP 2017), 2017, Hong Kong, China
Abstract
In this paper, we propose a novel cascade detection algorithm which focuses on point and line defects on TFT-LCD. At the first step of the algorithm, we use the gray level difference of su-bimage to segment the abnormal area. The second step is based on phase only transform (POT) which corresponds to the Discrete Fourier Transform (DFT), normalized by the magnitude. It can remove regularities like texture and noise. After that, we improve the method of setting regions of interest (ROI) with the method of edge segmentation and polar transformation. The algorithm has outstanding performance in both computation speed and accuracy. It can solve most of the defect detections including dark point, light point, dark line, etc.
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Songsong Yi, Songsong Yi, Xiaojun Wu, Xiaojun Wu, Zhiyang Yu, Zhiyang Yu, Zhuoya Mo, Zhuoya Mo, } "A cascade method for TFT-LCD defect detection", Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104200T (21 July 2017); doi: 10.1117/12.2282190; https://doi.org/10.1117/12.2282190
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