Microbolometer belongs to the group of thermal detectors and consist of temperature sensitive resistor which is exposed to measured radiation flux. Bolometer array employs a pixel structure prepared in silicon technology. The detecting area is defined by a size of thin membrane, usually made of amorphous silicon (a-Si) or vanadium oxide (VOx). FPAs are made of a multitude of detector elements (for example 384 × 288 ), where each individual detector has different sensitivity and offset due to detector-to-detector spread in the FPA fabrication process, and additionally can change with sensor operating temperature, biasing voltage variation or temperature of the observed scene. The difference in sensitivity and offset among detectors (which is called non-uniformity) additionally with its high sensitivity, produces fixed pattern noise (FPN) on produced image. Fixed pattern noise degrades parameters of infrared cameras like sensitivity or NETD. Additionally it degrades image quality, radiometric accuracy and temperature resolution. In order to objectively compare the two infrared cameras ones must measure and compare their parameters on a laboratory test stand. One of the basic parameters for the evaluation of a designed camera is NETD. In order to examine the NETD, parameters such as sensitivity and pixels noise must be measured. To do so, ones should register the output signal from the camera in response to the radiation of black bodies at two different temperatures. The article presets an application and measuring stand for determining the parameters of microbolometers camera. Prepared measurements were compared with the result of the measurements in the Institute of Optoelectronics, MUT on a METS test stand by CI SYSTEM. This test stand consists of IR collimator, IR standard source, rotating wheel with test patterns, a computer with a video grabber card and specialized software. The parameters of thermals cameras were measure according to norms and method described in literature.