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22 June 1989 Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays
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Proceedings Volume 1043, Laser Diode Technology and Applications; (1989) https://doi.org/10.1117/12.976363
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
We report measurements of the near-field phase of a two-dimensional array of grating surface emitter diode lasers. The measurements were performed by scanning single and double slits. We use the individually measured phases over 300 μm x 50 μm emitting regions to predict the beam quality, and we compare the predictions with measured data.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stanley L. Reinhold, J. Michael Finlan, John G. Lehman, and Scott M. Hamilton "Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays", Proc. SPIE 1043, Laser Diode Technology and Applications, (22 June 1989); https://doi.org/10.1117/12.976363
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