Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays

Stanley L. Reinhold; J. Michael Finlan; John G. Lehman; Scott M. Hamilton

doi:10.1117/12.976363

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22 June 1989 Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays

Stanley L. Reinhold, J. Michael Finlan, John G. Lehman, Scott M. Hamilton

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Proceedings Volume 1043, Laser Diode Technology and Applications; (1989) https://doi.org/10.1117/12.976363
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

We report measurements of the near-field phase of a two-dimensional array of grating surface emitter diode lasers. The measurements were performed by scanning single and double slits. We use the individually measured phases over 300 μm x 50 μm emitting regions to predict the beam quality, and we compare the predictions with measured data.

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Stanley L. Reinhold, J. Michael Finlan, John G. Lehman, and Scott M. Hamilton "Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays", Proc. SPIE 1043, Laser Diode Technology and Applications, (22 June 1989); https://doi.org/10.1117/12.976363

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