Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10433, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.
Huckridge, Ebert, and Bürsing: Front Matter: Volume 10433

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in Electro-Optical and Infrared Systems: Technology and Applications XIV, edited by David A. Huckridge, Reinhard Ebert, Helge Bürsing, Proceedings of SPIE Vol. 10433 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510613300

ISBN: 9781510613317 (electronic)

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Auffray, P., 0Q

Bacher, Emmanuel, 0N

Bai, Alexander, 1D

Bareła, Jarosław, 07

Barrat, Catherine, 16

Beldiceanu, Anca, 0F

Bienkowska, Beata, 10

Bijl, Piet, 12

Borcan, Octavia, 0F

Budnicki, Dawid, 11

Bürsing, Helge, 12

Canat, G., 0Q

Castaldo, Francesco, 1C

Cheremkhin, Pavel A., 0B, 0I

Chiquet, F., 0Q

Choi, Hyun-Jin, 14

Choi, WooJin, 0E

Chrzanowski, K., 0W

Conte, Roberto, 1C

Craig, Adam, 19

Czuba, Krzysztof, 0K

Deshors, Gilles, 13

Diamant, Idan, 15

Dijk, Judith, 0S

Dumitrescu, Eugen, 1D

Duncker, Hannes, 1D

Evtikhiev, Nikolay N., 0B, 0I

Fan, Jinxiang, 05

Farley, Vincent, 1B

Fauconier, Richard, 0O

Firmanty, Krzysztof, 07

Foing, Jean-Paul, 13

Fortunato, Luca, 1C

Fradcourt, Sébastien, 16

Freiman, Dov, 15

Gagnon, Marc-André, 1B

Gawron, Waldemar, 0Y

Giladi, Shira, 15

Glogowski, Tomasz, 02

Gomółka, Emilia, 0Y

Gorobets, Vadim A., 08

Guyot, Éric, 1B

Hackiewicz, Klaudia, 0X, 0Z

Hickman, Duncan L., 14

Hlosta, Pawel, 02

Holdynski, Zbigniew, 11

Jasik, Agata, 0K

Judd, K. P., 0M

Jung, DaeYoon, 0E

Kabashnikov, Vitaly, 09

Kanaev, A. V., 0M

Kaniewski, Janusz, 0K

Kastek, Mariusz, 07

Kębłowski, Artur, 0Y

Keen, James, 19

Keßler, Stefan, 12

Kim, Kyung Su, 14

Kim, SungSu, 0E

Kim, Yong Chan, 17

Kopeika, Natan S., 0P

Kopytko, Małgorzata, 0Y

Krasnov, Vitaly V., 0B, 0I

Kruithof, Maarten, 0T

Krupiński, Michał, 07

Kubiszyn, Łukasz, 0Y

Kunicki, Daniel, 10

Kuntsevich, Boris F., 08, 09

Labarre, Luc, 12

Lagueux, Philippe, 1B

Landeau, Stéphane, 13

Le Flohic, M., 0Q

Le, S.-D., 0Q

Lebow, P., 0M

Lee, Jae-Hoon, 17

Leibovich, Maor, 15

Lepot, Thierry, 16

Letka, Veronica, 19

Lindle, J. R., 0M

Lipinski, Stanislaw, 11

Lutz, Yves, 0N

Maciejewski, Marcin, 0A

Makara, Mariusz, 11

Manyk, Tetiana, 0Z

Marcotte, Frédérick, 1B

Marin, Constantin, 0F

Marshall, Andrew R. J., 19

Martyniuk, Piotr, 0X, 0Y, 0Z

Mergo, Pawel, 10, 11

Michalczewski, Krystian, 0Y

Monnin, David, 1A

Montlouis, Webert, 0O

Morton, Vince, 1B

Murawski, Michal, 10, 11

Nam, Hyun-Woo, 17

Napierala, Marek, 11

Nasilowski, Tomasz, 10, 11

Ndoye, Mandoye, 0O

Nieuwenhuizen, Robert P. J., 0S, 0T

Novak, K. M., 0M

Orżanowski, Tomasz, 0J

Ostrowski, Lukasz, 11

Pallier, G., 0Q

Papis-Polakowska, Ewa, 0K

Park, Dong-Jo, 17

Petrushevsky, Vladimir, 15

Pietrzak, Mateusz, 1A

Pigois, Laurent, 13

Piotrowski, Józef, 0Y

Piszczek, Marek, 0A

Polyakov, Alexandre V., 0C

Pomianek, Mateusz, 0A

Portalis, A., 0Q

Poturaj, Krzysztof, 11

Pracht, Monika, 03

Puchkouski, Ilya N., 08

Ramamonjisoa, Michael, 16

Repasi, Endre, 12

Rodin, Vladislav G., 0B, 0I

Rogalski, A., 0L, 0U

Ruan, Ningjuan, 0R

Rutkowski, Jarosław, 0Y, 0Z

Sankowska, Iwona, 0K

Schertzer, Stephane, 0N

Schutte, Klamer, 0S, 0T

Seo, HyoungKyu, 0E

Shabrov, Denis V., 08

Shifrina, Anna V., 0B

Smith, Moira I., 14

Stanczyk, Tomasz, 10

Starikov, Rostislav S., 0I

Stepniak, Slawomir, 02

Swiathy, Greggory, 13

Swiderski, Waldemar, 02, 03

Szostkiewicz, Lukasz, 10, 11

Szustakowski, Mieczysław, 0A

Szymanski, Michal O., 11

Tektonidis, Marco, 1A

Tenderenda, Tadeusz, 10

Toma, Alexandru, 0F

Ursu, Danut, 0F

van Eekeren, Adam W. M., 0S

Wang, Feng, 05

Watnik, A. T., 0M

Wittenstein, Wolfgang, 12

Wojcik, Grzegorz, 11

Yang, Song, 0R

Yu, Hyeong-Geun, 17

Zhao, Sisi, 0R

Zilberman, Arkadi, 0P

Conference Committee

Symposium Chair

  • Ric Schleijpen, TNO Defence, Security and Safety (Netherlands)

Symposium Co-Chairs

  • Karin Stein, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation IOSB (Germany)

  • Jan K. Jabczyński, Military University of Technology (Poland)

Conference Chairs

  • David A. Huckridge, Ridgeway Consulting (United Kingdom)

  • Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Helge Bürsing, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

Conference Programme Committee

  • Christopher C. Alexay, StingRay Optics, LLC (United States)

  • Gisele Bennett, Georgia Institute of Technology (United States)

  • Piet Bijl, TNO Defence, Security and Safety (Netherlands)

  • Rainer Breiter, AIM INFRAROT-MODULE GmbH (Germany)

  • David J. Clarke, Placing Value Co., Ltd. (Thailand)

  • Judith Dijk, TNO Defence, Security and Safety (Netherlands)

  • Bernd Eberle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Natan S. Kopeika, Ben-Gurion University of the Negev (Israel)

  • Robert A. Lamb, SELEX ES (United Kingdom)

  • Stephen T. Lee, Thales Optronics Ltd. (United Kingdom)

  • Antoni Rogalski, Military University of Technology (Poland)

  • Stanley R. Rotman, Ben-Gurion University of the Negev (Israel)

  • Armin L. Schneider, Institut Franco-Allemand de Recherches de Saint-Louis (France)

  • Philip J. Soan, Defence Science and Technology Laboratory (United Kingdom)

Session Chairs

  • 1 Active Imaging and Reduced SWAP Active Sensors

    Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    David A. Huckridge, Ridgeway Consulting (United Kingdom)

  • 2 Processing

    Helge Bürsing, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Stephen T. Lee, Thales Optronics Ltd. (United Kingdom)

  • 3 EO and IR Technology in Poland

    Antoni Rogalski, Wojskowa Akademia Techniczna im. Jaroslawa Dabrowskiego (Poland)

    David A. Huckridge, Ridgeway Consulting (United Kingdom)

    Bernd Eberle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Philip J. Soan, Defence Science and Technology Laboratory (United Kingdom)

  • 4 Imager Assessment and Characterisation

    Stephen T. Lee, Thales Optronics Ltd. (United Kingdom)

    Armin L. Schneider, Institut Franco-Allemand de Recherches de Saint-Louis (France)

  • 5 Polarimetric and Spectral Sensing

    David A. Huckridge, Ridgeway Consulting (United Kingdom)

    Robert A. Lamb, Leonardo MW Ltd. (United Kingdom)

    Gisele Bennett, Georgia Institute of Technology (United States)

  • 6 Passive Systems and Technologies

    Helge Bürsing, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Rainer Breiter, AIM INFRAROT-MODULE GmbH (Germany)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10433", Proc. SPIE 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV, 1043301 (27 November 2017); doi: 10.1117/12.2304300; https://doi.org/10.1117/12.2304300
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