6 October 2017 MTF measurement of IR optics in different temperature ranges
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Abstract
Infrared (IR) optical systems are at the core of many military, civilian and manufacturing applications and perform mission critical functions. To reliably fulfill the demanding requirements imposed on today’s high performance IR optics, highly accurate, reproducible and fast lens testing is of crucial importance. Testing the optical performance within different temperature ranges becomes key in many military applications.

Due to highly complex IR-Applications in the fields of aerospace, military and automotive industries, MTF Measurement under realistic environmental conditions become more and more relevant. A Modulation Transfer Function (MTF) test bench with an integrated thermal chamber allows measuring several sample sizes in a temperature range from -40 °C to +120°C. To reach reliable measurement results under these difficult conditions, a specially developed temperature stable design including an insulating vacuum are used.

The main function of this instrument is the measurement of the MTF both on- and off-axis at up to +/-70° field angle, as well as measurement of effective focal length, flange focal length and distortion.

The vertical configuration of the system guarantees a small overall footprint. By integrating a high-resolution IR camera with focal plane array (FPA) in the detection unit, time consuming measurement procedures such as scanning slit with liquid nitrogen cooled detectors can be avoided.

The specified absolute accuracy of +/- 3% MTF is validated using internationally traceable reference optics. Together with a complete and intuitive software solution, this makes the instrument a turn-key device for today’s state-of- the-art optical testing.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Bai, Hannes Duncker, Eugen Dumitrescu, "MTF measurement of IR optics in different temperature ranges", Proc. SPIE 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV, 104331D (6 October 2017); doi: 10.1117/12.2275308; https://doi.org/10.1117/12.2275308
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