FPGA-based firmware model for extended measurement systems with data quality monitoring

A. Wojenski; K. T. Pozniak; D. Mazon; M. Chernyshova

doi:10.1117/12.2281052

7 August 2017 FPGA-based firmware model for extended measurement systems with data quality monitoring

A. Wojenski, K. T. Pozniak, D. Mazon, M. Chernyshova

Author Affiliations +

Proceedings Volume 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017; 104454K (2017) https://doi.org/10.1117/12.2281052
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2017, 2017, Wilga, Poland

Abstract

Modern physics experiments requires construction of advanced, modular measurement systems for data processing and registration purposes. Components are often designed in one of the common mechanical and electrical standards, e.g. VME or uTCA. The paper is focused on measurement systems using FPGAs as data processing blocks, especially for plasma diagnostics using GEM detectors with data quality monitoring aspects. In the article is proposed standardized model of HDL FPGA firmware implementation, for use in a wide range of different measurement system. The effort was made in term of flexible implementation of data quality monitoring along with source data dynamic selection. In the paper is discussed standard measurement system model followed by detailed model of FPGA firmware for modular measurement systems. Considered are both: functional blocks and data buses. In the summary, necessary blocks and signal lines are described. Implementation of firmware following the presented rules should provide modular design, with ease of change different parts of it. The key benefit is construction of universal, modular HDL design, that can be applied in different measurement system with simple adjustments.

Citation Download Citation

A. Wojenski, K. T. Pozniak, D. Mazon, and M. Chernyshova "FPGA-based firmware model for extended measurement systems with data quality monitoring", Proc. SPIE 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017, 104454K (7 August 2017); https://doi.org/10.1117/12.2281052

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