28 September 2017 Latest developments on EUV reticle and pellicle research and technology at TNO
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Proceedings Volume 10446, 33rd European Mask and Lithography Conference; 1044603 (2017) https://doi.org/10.1117/12.2279672
Event: 33rd European Mask and Lithography Conference, 2017, Dresden, Germany
Abstract
At TNO an extensive EUV optics life time program has been running for over 15 years together with our partners ASML and Carl Zeiss. This has contributed to the upcoming introduction of EUV High Volume Manufacturing (HVM). To further help the industry with the introduction of EUV, TNO has worked on extending their facilities with a number of reticle and pellicle research infrastructure facilities. In this paper we will show some of the facilities that are available at TNO and shortly introduce their capabilities. Recently we have opened our EBL2 facility, which is an EUV Beam Line (EBL2) meant for studying the effects of high power EUV illumination on optics, reticles and pellicles up to the power roadmap of 500 W at intermediate Focus (IF). This facility is open to users from all over the world and is beneficial for the industry in helping developing alternative capping layers and contamination control strategies for optics lifetime, new absorber materials, pellicles and resists. The EBL2 system has seen first light in December 2016 and is now in the final stage of acceptance testing and qualification. It is expected that the system will be fully operational in the third quarter of 2017, and available for users. It is possible to transfer reticles to and from the EBL2 by means of the reticle handler using the dual pod interface. This secures backside cleanliness to NXE standards and thus enables wafer printing on a NXE tool in a later stage after the exposures and inspection at EBL2. Besides EBL2, a high performance and ultra-clean reticle handler is available at TNO. This handler incorporates our particle scanner Rapid Nano 4 for front side inspection of reticle blanks with a detection limit down to 20 nm particles. Attached to the handler is also an Optical Coherence Tomography (OCT) inspection tool for back-side reticle or pellicle inspection with a resolution down to 1 micron.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rogier Verberk, Rogier Verberk, Norbert Koster, Norbert Koster, Edwin te Sligte, Edwin te Sligte, Wilbert Staring, Wilbert Staring, } "Latest developments on EUV reticle and pellicle research and technology at TNO", Proc. SPIE 10446, 33rd European Mask and Lithography Conference, 1044603 (28 September 2017); doi: 10.1117/12.2279672; https://doi.org/10.1117/12.2279672
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