13 November 2017 A method for the determination of defect density from standard damage frequency measurements
Author Affiliations +
Abstract
This paper presents a method to make an estimation of the low fluence edge of the defect distribution, ρ(φ), from data collected from ISO 21254 standard damage frequency measurements. The cumulative probability of damage is formulated and the defect distribution is formulated as an expansion of an orthonormal set. This formulation allows the explicit isolation of the terms pertaining to the defect distribution and the intensity distribution. When the intensity distribution is specified, the resulting system is a polynomial in nature. Solutions for the systems relevant for Gaussian and are presented.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg, Carmen Menoni, "A method for the determination of defect density from standard damage frequency measurements", Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471R (13 November 2017); doi: 10.1117/12.2280611; https://doi.org/10.1117/12.2280611
PROCEEDINGS
10 PAGES


SHARE
Back to Top