PROCEEDINGS VOLUME 10448
SPIE OPTIFAB | 16-19 OCTOBER 2017
Optifab 2017
Proceedings Volume 10448 is from: Logo
SPIE OPTIFAB
16-19 October 2017
Rochester, New York, United States
Front Matter: Volume 10448
Proc. SPIE 10448, Front Matter: Volume 10448, 1044801 (7 December 2017); doi: 10.1117/12.2305130
Plenary Session
Proc. SPIE 10448, Freeform Optics: current challenges for future serial production, 1044802 (16 October 2017); doi: 10.1117/12.2280003
Proc. SPIE 10448, Concept for a new approach to realize complex optical systems in high volume, 1044803 (16 October 2017); doi: 10.1117/12.2279782
Grinding and Polishing Processes I
Proc. SPIE 10448, Analysis and optimization of surface profile correcting mechanism of the pitch lap in large-aperture annular polishing, 1044804 (16 October 2017); doi: 10.1117/12.2279771
Proc. SPIE 10448, APS 3D: a new benchmark in aspherical polishing, 1044805 (16 October 2017); doi: 10.1117/12.2279812
Proc. SPIE 10448, Novel high-NA MRF toolpath supports production of concave hemispheres , 1044806 (16 October 2017); doi: 10.1117/12.2279818
Proc. SPIE 10448, Ultrasonic grinding of optical materials, 1044807 (24 October 2017); doi: 10.1117/12.2279825
Proc. SPIE 10448, Etching hard brittle optical materials by masked ion beam, 1044809 (16 October 2017); doi: 10.1117/12.2279664
Grinding and Polishing Processes II
Proc. SPIE 10448, New surface smoothing technologies for manufacturing of complex shaped glass components, 104480A (16 October 2017); doi: 10.1117/12.2277189
Proc. SPIE 10448, The broad utility of Trizac diamond tile, 104480E (16 October 2017); doi: 10.1117/12.2277614
Proc. SPIE 10448, Impact of slurry pH on material removal rate and surface quality of polished fused silica, 104480F (16 October 2017); doi: 10.1117/12.2279798
Grinding and Polishing Processes III
Proc. SPIE 10448, New high-precision deep concave optical surface manufacturing capability, 104480H (16 October 2017); doi: 10.1117/12.2279809
Proc. SPIE 10448, Precision production: enabling deterministic throughput for precision aspheres with MRF, 104480I (16 October 2017); doi: 10.1117/12.2279829
Proc. SPIE 10448, Evolving rocket optics applications drive manufacturing advances , 104480J (16 October 2017); doi: 10.1117/12.2279850
Proc. SPIE 10448, Applying MRF to errors caused by optical and opto-mechanical assembly, 104480K (16 October 2017); doi: 10.1117/12.2279890
Proc. SPIE 10448, Novel process for production of micro lenses with increased centering accuracy and imaging performance, 104480L (16 October 2017); doi: 10.1117/12.2279801
Additive Manufacturing
Proc. SPIE 10448, Simple scattering analysis and simulation of optical components created by additive manufacturing, 104480N (16 October 2017); doi: 10.1117/12.2279781
Proc. SPIE 10448, Current use and potential of additive manufacturing for optical applications, 104480P (16 October 2017); doi: 10.1117/12.2279824
Optical Design and Engineering
Proc. SPIE 10448, Tolerancing aspheres based on manufacturing knowledge, 104480R (16 October 2017); doi: 10.1117/12.2279775
Proc. SPIE 10448, The importance of understanding manufacturing distributions in simulating manufactured performance of optical systems, 104480S (16 October 2017); doi: 10.1117/12.2279314
Proc. SPIE 10448, Integrating optical, mechanical, and test software (with applications to freeform optics), 104480T (16 October 2017); doi: 10.1117/12.2279827
Proc. SPIE 10448, Twyman effects in thin curved optics, 104480V (16 October 2017); doi: 10.1117/12.2279833
Diamond Turning
Proc. SPIE 10448, Analysis of the application of poly-nanocrystalline diamond tools for ultra precision machining of steel with ultrasonic assistance, 104480W (16 October 2017); doi: 10.1117/12.2279188
Proc. SPIE 10448, Micro-laser assisted machining: the future of manufacturing silicon optics, 104480X (16 October 2017); doi: 10.1117/12.2281044
Proc. SPIE 10448, UPC 300 ultra precise fast tool freeform machining system with integrated metrology for corrective machining, 104480Y (16 October 2017); doi: 10.1117/12.2279802
Freeform Fabrication and Testing
Proc. SPIE 10448, Fabrication and correction of freeform surface based on Zernike polynomials by slow tool servo, 1044813 (16 October 2017); doi: 10.1117/12.2279270
Proc. SPIE 10448, Precision asphere and freeform optics manufacturing using plasma jet machining technology , 1044814 (16 October 2017); doi: 10.1117/12.2279786
Proc. SPIE 10448, Computer aided manufacturing for complex freeform optics, 1044815 (16 October 2017); doi: 10.1117/12.2279794
Proc. SPIE 10448, Shape measurement of freeform surfaces using experimental ray tracing, 1044816 (16 October 2017); doi: 10.1117/12.2279797
Proc. SPIE 10448, Metrology for the manufacturing of freeform optics, 1044817 (16 October 2017); doi: 10.1117/12.2279819
Proc. SPIE 10448, Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry, 1044818 (16 October 2017); doi: 10.1117/12.2279821
Metrology I
Proc. SPIE 10448, From optics testing to micro optics testing , 1044819 (16 October 2017); doi: 10.1117/12.2279656
Proc. SPIE 10448, Asphere cross testing: an exercise in uncertainty estimation, 104481A (16 October 2017); doi: 10.1117/12.2279828
Proc. SPIE 10448, Advancements in non-contact metrology of asphere and diffractive optics, 104481B (8 November 2017); doi: 10.1117/12.2279872
Proc. SPIE 10448, Spectrally controlled interferometry for measurements of flat and spherical optics, 104481C (16 October 2017); doi: 10.1117/12.2279811
Proc. SPIE 10448, Surface characterization protocol for precision aspheric optics, 104481D (16 October 2017); doi: 10.1117/12.2279804
Metrology II
Proc. SPIE 10448, SUN: A fully automated interferometric test bench aimed at measuring photolithographic grade lenses with a sub nanometer accuracy, 104481E (16 October 2017); doi: 10.1117/12.2279789
Proc. SPIE 10448, Centering steep aspheric surfaces, 104481G (16 October 2017); doi: 10.1117/12.2279770
Proc. SPIE 10448, Automated asphere centration testing with AspheroCheck UP, 104481H (16 October 2017); doi: 10.1117/12.2279674
Metrology III
Proc. SPIE 10448, Tailored complex degree of mutual coherence for plane-of-interest interferometry with reduced measurement uncertainty, 104481I (16 October 2017); doi: 10.1117/12.2279834
Proc. SPIE 10448, Absolute surface form measurement of large flat optics based on oblique incidence method, 104481J (14 November 2017); doi: 10.1117/12.2279873
Optical Materials
Proc. SPIE 10448, Stability requirements for two-beam interference lithography diffraction grating manufacturing, 104481L (16 October 2017); doi: 10.1117/12.2277007
Proc. SPIE 10448, Thermal instability of BK7 and how it affects the manufacturing of large high precision surfaces, 104481M (16 October 2017); doi: 10.1117/12.2279807
Proc. SPIE 10448, Commercializing potassium terbium fluoride, KTF (KTb3F10) faraday crystals for high laser power optical isolator applications, 104481N (23 October 2017); doi: 10.1117/12.2279684
Proc. SPIE 10448, UV-cured polymer optics, 104481O (16 October 2017); doi: 10.1117/12.2280002
Proc. SPIE 10448, Brilluoin spectroscopy application for express, non-contact testing of glass and polymer products, 104481P (16 October 2017); doi: 10.1117/12.2279701
Proc. SPIE 10448, Application of speckle shearing interferometry to the evaluation of creep strain in elastomers, 104481Q (16 October 2017); doi: 10.1117/12.2277427
Coating and Cleaning
Proc. SPIE 10448, Rare earth-based low-index films for IR and multispectral thin film solutions, 104481S (16 October 2017); doi: 10.1117/12.2279822
Proc. SPIE 10448, Prospects for the enhancement of PIAD processes by plasma diagnostics, 104481T (16 October 2017); doi: 10.1117/12.2279800
Proc. SPIE 10448, Multilayer coating of optical substrates by ion beam sputtering, 104481V (16 October 2017); doi: 10.1117/12.2279788
Poster Session
Proc. SPIE 10448, Non-conventional optomechanical choppers: analysis and design of novel prototypes, 104481W (16 October 2017); doi: 10.1117/12.2275937
Proc. SPIE 10448, High precision processing CaF2 application research based on the magnetorheological finishing technology, 104481Y (16 October 2017); doi: 10.1117/12.2279477
Proc. SPIE 10448, An optimized method to calculate error correction capability of tool influence function in frequency domain, 104481Z (16 October 2017); doi: 10.1117/12.2279655
Proc. SPIE 10448, Precision lens assembly with alignment turning system, 1044821 (16 October 2017); doi: 10.1117/12.2279667
Proc. SPIE 10448, Cheap and fast measuring roughness on big surfaces with an imprint method, 1044822 (16 October 2017); doi: 10.1117/12.2279671