16 October 2017 Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry
Author Affiliations +
Proceedings Volume 10448, Optifab 2017; 1044818 (2017) https://doi.org/10.1117/12.2279821
Event: SPIE Optifab, 2017, Rochester, New York, United States
Recent advances in polishing and metrology have addressed many of the challenges in the fabrication and metrology of freeform surfaces, and the manufacture of these surfaces is possible today. However, achieving the form and mid-spatial frequency (MSF) specifications that are typical of visible imaging systems remains a challenge. Interferometric metrology for freeform surfaces is thus highly desirable for such applications, but the capability is currently quite limited for freeforms. In this paper, we provide preliminary results that demonstrate accurate, high-resolution measurements of freeform surfaces using prototype software on QED’s ASI™ (Aspheric Stitching Interferometer).
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chris Supranowitz, Chris Supranowitz, Chris Maloney, Chris Maloney, Paul Murphy, Paul Murphy, Paul Dumas, Paul Dumas, } "Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry", Proc. SPIE 10448, Optifab 2017, 1044818 (16 October 2017); doi: 10.1117/12.2279821; https://doi.org/10.1117/12.2279821


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