14 November 2017 Absolute surface form measurement of large flat optics based on oblique incidence method
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Proceedings Volume 10448, Optifab 2017; 104481J (2017) https://doi.org/10.1117/12.2279873
Event: SPIE Optifab, 2017, Rochester, New York, United States
In this paper, a test method based on oblique incidence is practically implemented in the interferometric measurement process. Three sets of wavefront data are achieved through cavity interference measurement with a Fizeau interferometer and one oblique incidence measurement. An iterative algorithm is applied to retrieve the matrix of transmission flatness and reference flatness. The new method can not only calibrate the reference flat error of large aperture interferometer, but also provide the absolute measurement method for large rectangular optical components applied in high power laser systems.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shijie Liu, Shijie Liu, Longbo Xu, Longbo Xu, You Zhou, You Zhou, Shi Men, Shi Men, Yunbo Bai, Yunbo Bai, Xueke Xu, Xueke Xu, Jianda Shao, Jianda Shao, } "Absolute surface form measurement of large flat optics based on oblique incidence method", Proc. SPIE 10448, Optifab 2017, 104481J (14 November 2017); doi: 10.1117/12.2279873; https://doi.org/10.1117/12.2279873


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