13 June 2017 Out of the lab and into the fab: Nano-alignment as an enabler for Silicon Photonics’ next chapter
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Proceedings Volume 10449, Fifth International Conference on Optical and Photonics Engineering; 104490Z (2017) https://doi.org/10.1117/12.2270400
Event: Fifth International Conference on Optical and Photonics Engineering, 2017, Singapore, Singapore
Abstract
The rapid advent of Silicon Photonics presents many challenges for test and packaging. Here we concisely review SiP device attributes that differ significantly from classical photonic configurations, with a view to the future beyond current, connectivity-oriented silicon photonics developments, looking to such endeavors as all-optical computing and quantum computing. The necessity for nano-precision alignment of optical elements in test and packaging operations quickly emerges as the unfilled need. We review the industrial test and packaging solutions developed back in the 1997-2001 photonics boom to address the needs of that era's devices, and map their gaps with the new SiP device classes. Finally we review the new state-of-the-art of recent advances in the field that address these gaps.
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Scott Jordan, "Out of the lab and into the fab: Nano-alignment as an enabler for Silicon Photonics’ next chapter", Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104490Z (13 June 2017); doi: 10.1117/12.2270400; https://doi.org/10.1117/12.2270400
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