13 June 2017 Improvement of phase measurement accuracy and stability in dual-wavelength common-path digital holographic microscopy
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Proceedings Volume 10449, Fifth International Conference on Optical and Photonics Engineering; 104491W (2017) https://doi.org/10.1117/12.2270774
Event: Fifth International Conference on Optical and Photonics Engineering, 2017, Singapore, Singapore
Abstract
A dual-wavelength common-path digital holographic microscopy is presented to simultaneously improve the phase measurement accuracy and stability. Two laser beams with different wavelength are reflected by the front and back surface of a parallel glass plate to form the composite hologram in the lateral shearing region, and a shorter synthetic wavelength Λ289nm is obtained by calculating the arctangent and product of the two reconstructed complex amplitudes. Thus, phase speckle noise can be reduced in the dual-wavelength numerical reconstruction process, and the phase measurement accuracy and stability can be improved. The experiment results of the peony pollens specimen show the feasibility of the proposed configuration.
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Jianglei Di, Jianglei Di, Yu Song, Yu Song, Teli Xi, Teli Xi, Jiwei Zhang, Jiwei Zhang, Ying Li, Ying Li, Chaojie Ma, Chaojie Ma, Kaiqiang Wang, Kaiqiang Wang, Jianlin Zhao, Jianlin Zhao, } "Improvement of phase measurement accuracy and stability in dual-wavelength common-path digital holographic microscopy", Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104491W (13 June 2017); doi: 10.1117/12.2270774; https://doi.org/10.1117/12.2270774
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