13 June 2017 Single-shot color fringe projection profilometry using two-step phase shifting and centerline marker
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Proceedings Volume 10449, Fifth International Conference on Optical and Photonics Engineering; 1044922 (2017) https://doi.org/10.1117/12.2270797
Event: Fifth International Conference on Optical and Photonics Engineering, 2017, Singapore, Singapore
Abstract
A single-shot color fringe projection profilometry is proposed to measure a diffuse object by using two-step phase shifting and centerline marker. One color fringe pattern encoded with two sinusoidal patterns and one rectangular pulse pattern is projected by a DLP project and recorded by a CCD camera. The approach requires two sinusoidal patterns, which is composed of the red and blue components, to establish two-step phase shifting for wrapping the primary phase, and needs a centerline marker, which is encoded in the green channel, to obtain the phase order for unwrapping the absolute phase. Simulation and experiment results demonstrate that the proposed approach is able to effectively unwrap the absolute phase and compensate the phase errors.
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Shuo Xing, Ping Chen, Yi Xiao, "Single-shot color fringe projection profilometry using two-step phase shifting and centerline marker", Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 1044922 (13 June 2017); doi: 10.1117/12.2270797; https://doi.org/10.1117/12.2270797
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