13 June 2017 The error correction for EMD profilometry
Author Affiliations +
Proceedings Volume 10449, Fifth International Conference on Optical and Photonics Engineering; 104492Y (2017) https://doi.org/10.1117/12.2270904
Event: Fifth International Conference on Optical and Photonics Engineering, 2017, Singapore, Singapore
Abstract
A novel Empirical mode decomposition (EMD) profilometry has been developed for dynamic measurement, which can reconstruct the 3D shape of an object by projecting only fringe pattern. The distinctive technique of the system is the newly developed Sinusoids-assisted Bidimensional EMD (SBEMD) algorithm, which can decompose an image into different pure scales. As even very detailed information can be purely extracted for analysis, EMD profilometry is able to measure the object with complex or discontinuous surface. However, the Gamma errors of the system become more obvious just due to these advantages of SBEMD, which also can be represented as high harmonics. In this paper, a simple yet effective phase filtering method is proposed also based on the SBEMD, which can filter the gamma errors but meantime avoid losing detailed phase. Experiments show the effectiveness of the method.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chenxing Wang, Chenxing Wang, Feipeng Da, Feipeng Da, } "The error correction for EMD profilometry", Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104492Y (13 June 2017); doi: 10.1117/12.2270904; https://doi.org/10.1117/12.2270904
PROCEEDINGS
7 PAGES


SHARE
Back to Top