31 May 1989 Finite Element Analysis Of Thermal Transients In Multi-Stripe Laser Diode Arrays
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Proceedings Volume 1045, Modeling and Simulation of Laser Systems; (1989) https://doi.org/10.1117/12.951326
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
The NASTRAN finite element code was used to simulate the temperature transients in the active area of laser diode arrays caused by driving the array with a pulsed waveform. A ten-stripe multi-quantum-well (MQW) structure was used. The thermal impedance of the array was also determined and compared to experimental values obtained by monitoring the threshold dependance of the device during pulsed and cw operation. The single-stripe diode was also modeled for comparison purposes.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wendy L. Lippincott, Wendy L. Lippincott, Anne E. Clement, Anne E. Clement, } "Finite Element Analysis Of Thermal Transients In Multi-Stripe Laser Diode Arrays", Proc. SPIE 1045, Modeling and Simulation of Laser Systems, (31 May 1989); doi: 10.1117/12.951326; https://doi.org/10.1117/12.951326
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