Open Access Paper
16 August 2017 Practice and thinking on examination way reform of optoelectronic detection technology course
Xue-lian Yu, Jia-cheng Zhang, Tao Shen, Yan-ling Xiong, Wen-long Yang
Author Affiliations +
Proceedings Volume 10452, 14th Conference on Education and Training in Optics and Photonics: ETOP 2017; 1045254 (2017) https://doi.org/10.1117/12.2269611
Event: 14th Conference on Education and Training in Optics and Photonics, ETOP 2017, 2017, Hangzhou, China
Abstract
Choosing a reasonable examination way is beneficial to the cultivation of high quality talents. Recently, the conventional college examination methods involve writing and oral test, which is extremely focused on academic performance and caused the separation between teachers and examinations. Optoelectronic detection technology is a specialized course with strong applicability. Therefore, we proposed a diverse form and scientific content method. It is proved that the students receive better learning effect and improve learning and engineering practice ability compared with the traditional assessment methods.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xue-lian Yu, Jia-cheng Zhang, Tao Shen, Yan-ling Xiong, and Wen-long Yang "Practice and thinking on examination way reform of optoelectronic detection technology course", Proc. SPIE 10452, 14th Conference on Education and Training in Optics and Photonics: ETOP 2017, 1045254 (16 August 2017); https://doi.org/10.1117/12.2269611
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KEYWORDS
Optoelectronics

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