22 August 2017 Electrical addressing and temporal tweezing of localized pulses in passively mode-locked semiconductor lasers
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Proceedings Volume 10453, Third International Conference on Applications of Optics and Photonics; 104532P (2017) https://doi.org/10.1117/12.2276316
Event: Third International Conference on Applications of Optics and Photonics, 2017, Faro, Portugal
Abstract
This work presents an overview of a combined experimental and theoretical analysis on the manipulation of temporal localized structures (LSs) found in passively Vertical-Cavity Surface-Emitting Lasers coupled to resonant saturable absorber mirrors. We show that the pumping current is a convenient parameter for manipulating the temporal Localized Structures, also called localized pulses. While short electrical pulses can be used for writing and erasing individual LSs, we demonstrate that a current modulation introduces a temporally evolving parameter landscape allowing to control the position and the dynamics of LSs. We show that the localized pulses drifting speed in this landscape depends almost exclusively on the local parameter value instead of depending on the landscape gradient, as shown in quasi-instantaneous media. This experimental observation is theoretically explained by the causal response time of the semiconductor carriers that occurs on an finite timescale and breaks the parity invariance along the cavity, thus leading to a new paradigm for temporal tweezing of localized pulses. Different modulation waveforms are applied for describing exhaustively this paradigm. Starting from a generic model of passive mode-locking based upon delay differential equations, we deduce the effective equations of motion for these LSs in a time-dependent current landscape.
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J. Javaloyes, P. Camelin, M. Marconi, M. Giudici, "Electrical addressing and temporal tweezing of localized pulses in passively mode-locked semiconductor lasers", Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532P (22 August 2017); doi: 10.1117/12.2276316; https://doi.org/10.1117/12.2276316
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