22 August 2017 THz metrology for active electronic devices: state of the art and challenges
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Proceedings Volume 10453, Third International Conference on Applications of Optics and Photonics; 104532Z (2017) https://doi.org/10.1117/12.2276354
Event: Third International Conference on Applications of Optics and Photonics, 2017, Faro, Portugal
Abstract
The area of terahertz science and applications has grown dramatically in the last 30 years. Instrumental platforms for THz measurements have also proliferated, and now include laser-based, electronic, opto-electronic, and microwave photonics devices. As the field matured, metrology and standardization have gained focused attention, resulting in an increasing number of publications and a book devoted to the subject. However, these have been primarily focused on photonic-based free-space techniques and their particular demands and issues. This paper presents a brief review of metrology requirements for active THz electronic devices, the available instrumentation, state of the art, and challenges.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mira Naftaly, "THz metrology for active electronic devices: state of the art and challenges", Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532Z (22 August 2017); doi: 10.1117/12.2276354; https://doi.org/10.1117/12.2276354
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