1 September 2017 Front Matter: Volume 10455
Proceedings Volume 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods; 1045501 (2017) https://doi.org/10.1117/12.2292559
Event: Twelfth Integrated Optics – Sensors, Sensing Structures and Methods Conference, 2017, Szczyrk-Gliwice, Poland
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10455, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.
Struk and Pustelny: Front Matter: Volume 10455

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, edited by Przemyslaw Struk, Tadeusz Pustelny, Proceedings of SPIE Vol. 10455 (SPIE, Bellingham, WA, 2017) Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510613911

ISBN: 9781510613928 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00037_PSISDG10455_1045501_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a seven-digit CID article numbering system in which:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

    The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Arciuch, Artur, 0A

Asquini, Rita, 0X

Barczak, Kamil, 0R

Barney, E., 04

Benson, T. M., 04

Benyahia, Djalal, 07, 0F

Beres-Pawlik, E., 04

Bieda, Marcin S., 0Y

Bielecki, Z., 0S

Blahut, Marek, 03

Bogdanowicz, Robert, 0E

Boguski, Jacek, 0T

Budner, Bogusław, 07, 0F

Chodorow, U., 06

Copik, Izabela, 0L

Czyzewska, L., 0P

d’Alessandro, Antonio, 0X

Ficek, Mateusz, 0E

Furniss, D., 04

Gardas, Mateusz, 0E

Gawlikowski, Maciej, 0L

Gawron, W., 06

Gil, M., 0P

Głowacki, Maciej J., 0E, 0L

Gorczyca, Kinga, 0T

Grad, Leszek, 09, 0B

Grodecki, Kacper, 07, 0F

Grudzien, A., 02, 0C

Gut, Kazimierz, 0M

Hackiewicz, K., 05

Henig, Aleksandra, 07, 0F

Herman, J., 06

Hirsch, M., 0Q

Jankiewicz, Bartłomiej, 07, 0F

Kałużyński, P., 0U

Kębłowski, Artur, 0T

Kłos, K., 0S

Kopytko, Małgorzata, 0V

Kowalewski, Andrzej, 05, 06, 0V

Kowalski, M., 02, 0C

Kubacki, Krzysztof, 0L

Kubiszyn, Łukasz, 07, 0F

Kula, P., 06

Kustosz, Roman, 0L

Lesiak, Piotr, 0Y

Maciak, Erwin, 0N, 0U, 0W

Maciejewski, Marcin, 0G

Madejczyk, Paweł, 0D, 0T

Majchrowicz, D., 0Q

Markowska, Olga, 0V

Martyniuk, Piotr, 05, 06, 07, 0D, 0F, 0T, 0V

Mazikowski, Adam, 0J

Maźniewski, Krzysztof, 0R

Mazur, R., 06

Mergo, P., 0P

Michalczewski, Krystian, 07, 0F

Mikołajczyk, J., 0S

Morawiak, P., 06

Mrotek, Marcin, 0H

Murawska, Monika, 08

Murawski, Krzysztof, 07, 08, 09, 0A, 0B, 0F

Pacholewicz, Jerzy, 0L

Palka, Norbert, 0C

Pałys, Tomasz, 0A

Piecek, W., 06

Piramidowicz, R., 04

Piszczek, Marek, 0G

Pomianek, Mateusz, 0G

Procek, Marcin, 0N, 0U

Prokopiuk, Artur, 0O

Pustelny, Tadeusz, 0K

Pydzińki, Paweł, 0L

Rutecka, B., 0S

Rutkowska, Katarzyna A., 0X

Rutkowski, Jarosław, 05, 0D, 0V

Sakr, H., 04

Sawczak, Mirosław, 0E

Seddon, A. B., 04

Sobotka, Piotr, 0Y

Sojka, L., 04

Stolarczyk, Agnieszka, 0N, 0U

Struk, Przemyslaw, 0K

Sujecki, S., 04

Sulej, Wojciech, 09, 0B

Szabra, D., 0S

Szustakowski, Mieczysław, 02, 0G

Tang, Z., 04

Tyszkiewicz, Cuma, 0I

Umana-Membreno, Gilberto A., 0T

Walczak, Andrzej, 0A

Wójcik, G., 0P

Wojtas, J., 0S

Woliński, Tomasz R., 0Y

Wróbel, Jarosław, 0T

Wysmolek, A., 07

Zakliczyński, Michał, 0L

Conference Committee

Conference Chair

  • Tadeusz Pustelny, Silesian University of Technology (Poland)

Honorary Conference Chair

  • Wieslaw L. Wolinski, Warsaw University of Technology (Poland)

Scientific Committee

  • Tadeusz Pustelny, Silesian University of Technology (Poland)

  • Tomasz R. Wolinski, Institute of Electronic Materials Technology (Poland)

  • Andrzej Napieralski, Lodz University of Technology (Poland)

  • Wojciech Gawlik, Jagiellonian University Cracow (Poland)

  • Wieslaw Królikowski, University of Canberra (Australia)

  • Krzysztof Abramski, Wroclaw University of Technology (Poland)

  • Zbigniew Bielecki, Military University of Technology (Poland)

  • Marek Blahut, Silesian University of Technology (Poland)

  • Dominik Dorosz, Bialystok University of Technology (Poland)

  • Jan Dorosz, Bialystok University of Technology (Poland)

  • Jan Jakubczyk, Optiwave Systems Inc. (Canada)

  • Zdzislaw Jankiewicz, Military University of Technology (Poland)

  • Leszek Jaroszewicz, Military University of Technology (Poland)

  • Zygmunt Mierczyk, Military University of Technology (Poland)

  • Tadeusz Pisarkiewicz, University of Science and Technology (Poland)

  • Jan Szmidt, Warsaw University of Technology (Poland)

  • Tomasz Szoplik, University of Warsaw (Poland)

  • Mieczyslaw Szustakowski, Military University of Technology (Poland)

  • Waclaw Urbanczyk, Wroclaw University of Technology (Poland)

Organizing Committee

  • Tadeusz Pustelny, Silesian University of Technology (Poland)

  • Przemyslaw Struk, Silesian University of Technology (Poland)

  • Aneta Olszewska, Silesian University of Technology (Poland)

  • Sabina Drewniak, Silesian University of Technology (Poland)

  • Kamil Barczak, Silesian University of Technology (Poland)

  • Marcin Procek, Silesian University of Technology (Poland)

  • Marek Błahut, Silesian University of Technology (Poland)

Introduction

The Conference on INTEGRATED OPTICS: Sensors, Sensing Structures and Methods is an international scientific forum of photonics and modern nanotechnology.

The Integrated Optics (IOS) conference is organized every year since 2004 and in 2017 it was held for the twelfth time.

IOS’2017 took place from February 27 to March 3, 2017 in Szczyrk, in the META Hotel, in the Beskidy Mountains in southern Poland, a real winter scenery. IOS’2017 was attended by 60 scientists, mainly from Poland, as well as from Australia, Qatar and Slovakia.

The main organizer of the 12th IOS’2017 was the Photonics Society of Poland in cooperation with SPIE. The technical co-organizers of the conference were: the Upper Silesian Division of the Polish Acoustical Society and the Optoelectronic Department at the Silesian University of Technology in Gliwice (Poland).

The Honorary patronage of the Conference has taken over by Professor Wieslaw Wolinski – Full Member of the Polish Academy of Sciences.

During the IOS’2017 conference thirty-eight oral lectures were held in 8 scientific sessions. In addition, twenty one posters were presented during the poster session.

The main aim of the Conference was an exchange of knowledge in the scope of practical applications of photonics, integrated optics and related scientific areas. The objectives of the Conference were also presentations of experiences in the field of technology and theoretical analysis of optoelectronic sensors and practical applications of sensing structures and systems, as well as new methods in the field of modern metrology.

The IOS’2017 Conference has contributed to the extension of relations between scientific groups and has enabled the intensification of common cooperation for the development of photonics and integrated optics.

Tadeusz Pustelny

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10455", Proc. SPIE 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 1045501 (1 September 2017); doi: 10.1117/12.2292559; https://doi.org/10.1117/12.2292559
PROCEEDINGS
10 PAGES


SHARE
Back to Top