1 September 2017 Theoretical analysis of a spectrometric interferometer based on silicon-on insulator (SOI) waveguide layers
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Proceedings Volume 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods; 104550M (2017) https://doi.org/10.1117/12.2282764
Event: Twelfth Integrated Optics – Sensors, Sensing Structures and Methods Conference, 2017, Szczyrk-Gliwice, Poland
Abstract
The paper presents an analysis of spectral interference in silicon-on-insulator (SIO) planar waveguide structures. The analysis was performed for the wavelength range of 1540nm-1560nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the propagation conditions results in a change of the recorded signal shape.
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Kazimierz Gut, "Theoretical analysis of a spectrometric interferometer based on silicon-on insulator (SOI) waveguide layers", Proc. SPIE 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 104550M (1 September 2017); doi: 10.1117/12.2282764; https://doi.org/10.1117/12.2282764
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