2 January 2018 Partial coherence and the influence of overlap and curvature in ptychography
Author Affiliations +
Abstract
In this paper, we use optical coherence theory to define the limit for the spatial coherence length with respect to the degree of overlap between adjacent probe positions in ptychography. The influence of the degree of curvature of the probe in relation to partial coherence in the Fresnel geometry for a fixed overlap is also considered. This work has implications for the application of ptychographic coherent imaging using partially coherent sources. We validate these results through a simulation study of coherence versus overlap parameter and curvature.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guido Cadenazzi, Guido Cadenazzi, Bo Chen, Bo Chen, Timur Gureyev, Timur Gureyev, H. M. Quiney, H. M. Quiney, K. A. Nugent, K. A. Nugent, B. Abbey, B. Abbey, } "Partial coherence and the influence of overlap and curvature in ptychography", Proc. SPIE 10456, Nanophotonics Australasia 2017, 104565X (2 January 2018); doi: 10.1117/12.2283395; https://doi.org/10.1117/12.2283395
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT

Phase retrieval for crystalline specimens
Proceedings of SPIE (September 05 2017)
Phase-contrast x-ray radiography using the X pinch radiation
Proceedings of SPIE (November 13 2001)
Partial coherent imaging using the Grating Light Valve
Proceedings of SPIE (June 03 2002)
Moire in interference with spatial coherence beams
Proceedings of SPIE (July 18 1999)
Advances in ptychographical coherent diffractive imaging
Proceedings of SPIE (September 04 2008)

Back to Top