24 October 2017 Experiment of optical axis angle of electro-optic crystal by conoscopic interference and x-ray diffraction method
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Proceedings Volume 10457, AOPC 2017: Laser Components, Systems, and Applications; 104570R (2017) https://doi.org/10.1117/12.2283131
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
Owing to the advantages of low loss, high spatial uniformity and high damage threshold, plasma electrode pockels cell (PEPC) is the key element of multi-pass amplifying technology in large laser facilities. Properties of PEPC is directly affected by the optical axis angle of the electro-optic crystal. Therefore, high precision measurement of the optical axis angle is indispensable. X-ray diffraction analysis method is a traditional way to determine the direction of optical axis of crystal, which is presented. By using conoscopic interference technique, a measurement system for optical axis angle of electro-optic crystal is introduced. The principle of conoscopic interference method is described in detail, and a series of techniques are implied in this measurement system to improve the accuracy. The optical axis angle two different electro-optic crystal is measured by X-ray diffraction analysis method and our conoscopic interference measurement system, respectively. The absolute error is less than 0.01mrad, while the relative error is nearly 2%.
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Dong Li, Dong Li, Yong Liu, Yong Liu, Xu Liu, Xu Liu, Hongzhen Jiang, Hongzhen Jiang, Fanglan Zheng, Fanglan Zheng, } "Experiment of optical axis angle of electro-optic crystal by conoscopic interference and x-ray diffraction method", Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104570R (24 October 2017); doi: 10.1117/12.2283131; https://doi.org/10.1117/12.2283131
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