24 October 2017 Effect of ridge structure on electro-optical characteristics of ridge-waveguide lasers with low vertical divergence based on photonic crystal structure
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Proceedings Volume 10457, AOPC 2017: Laser Components, Systems, and Applications; 104572B (2017) https://doi.org/10.1117/12.2284797
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
Ridge-waveguide (RW) lasers based on photonic crystal structure were fabricated and measured. We investigated the effect of residual layer thickness (corresponding to etching depth) and ridge width on electro-optical characteristics of RW lasers. For deep-etching RW lasers, although lateral beam quality factor M2 is better than that of shallow-etching RW lasers, the other characteristics such as output power are much less than that of shallow-etching RW lasers. The calculating results indicate that RW lasers with ridge width w ≥ 8 μm will operate in mixing mode. The experimentally results of various ridge width RW lasers show that RW laser with 7 μm ridge operated in single mode over the whole measurement range and RW laser with 8 μm ridge change from single-mode operation to mixing-mode operation with the increasing of driving current. The device with 7-μm-wide ridge and 3-mm-long cavity obtain 2 W single-transverse-mode optical power and 59% maximum power conversion efficiency. The lateral beam quality factors M2 values are less than 1.7 over the whole measuring range.
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Shaoyu Zhao, Aiyi Qi, Hongwei Qu, Xuyan Zhou, Yuzhe Lin, Yufei Wang, Wanhua Zheng, "Effect of ridge structure on electro-optical characteristics of ridge-waveguide lasers with low vertical divergence based on photonic crystal structure", Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104572B (24 October 2017); doi: 10.1117/12.2284797; https://doi.org/10.1117/12.2284797
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