24 October 2017 Target region location method applied in single-pixel imaging
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Proceedings Volume 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing; 104580E (2017) https://doi.org/10.1117/12.2282354
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
Single-pixel imaging (SPI) is a new method to obtain an image using a detector without spatial resolution. Owing to the excellent characteristics of anti-noise and high signal-to-noise ratio, SPI is applied to detect and locate the target region in the week illumination condition. In most previous target detection and location approaches, the original target needs to be imaged. However, the time consumption of image reconstruction for SPI is much larger than conventional imaging method, which indicates a low efficiency for target region location using SPI. In this paper, we propose a target region location method based on Fourier single-pixel imaging to locate the target without retrieving target image. The proposed method adopts the Fourier single-pixel imaging to obtain few Fourier coefficients of the target image, then the target region is located by the central slice theorem and edge detection algorithm. Experiment shows the proposed method has an excellent characteristic of low time consumption and can effectively locate the target region.
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Hongzhi Jiang, Shuguang Zhu, Huijie Zhao, Xudong Li, "Target region location method applied in single-pixel imaging", Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 104580E (24 October 2017); doi: 10.1117/12.2282354; https://doi.org/10.1117/12.2282354
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