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24 October 2017 Improved bi-frequency scheme to realize high-precision 3D shape measurement
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Proceedings Volume 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing; 104580Y (2017) https://doi.org/10.1117/12.2284276
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
An improved bi-frequency phase-shifting technique based on a multi-view fringe projection system is proposed, which significantly enhances the measurement precision without compromising the measurement speed. Based on the geometric constraints in a multi-view system, the unwrapped phase of the low-frequency (10-period) fringes can be obtained directly, which serves as a reference to unwrap the high-frequency phase map with a total number of periods of up to 160. Experiments on both static and dynamic scenes are performed, verifying that our method can achieve real-time and high-precision 3-D measurement with a precision of about 50 μm.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tianyang Tao, Qian Chen, Shijie Feng, Yan Hu, and Chao Zuo "Improved bi-frequency scheme to realize high-precision 3D shape measurement", Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 104580Y (24 October 2017); https://doi.org/10.1117/12.2284276
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