24 October 2017 Research on the influence of baffle in luminous flux measurement with integrating sphere
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Proceedings Volume 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics; 104600X (2017) https://doi.org/10.1117/12.2284390
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
In the field of optical metrology, luminous flux is an important index to characterize the quality of light source. There are two kinds of method to measure it that one is light distribution surface method and the other is integrating sphere method. In the integrating sphere method, the baffle which is a key part of integrating sphere has important effects on the measurement results. The paper analyzes in detail the principle of an ideal integrating sphere. We change the relative position and shape of baffle inside the sphere during testing. By experiments, measured luminous flux values at different distances between the light source and baffle are obtained, which we used to take analysis of the effects of different baffle position and shape on the measurement. And then we obtain the optimum position and shape of baffle for luminous flux measurements. Based on the conclusion, we develop the methods and apparatus to improve the luminous flux measurement accuracy and reliability, which makes our unifying and transferring work of the luminous flux more accurate in East China and provides effective protection for our traceability system
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fangsheng Lin, Fangsheng Lin, Tiecheng Li, Tiecheng Li, Biyong Huang, Biyong Huang, Dejin Yin, Dejin Yin, Muyao Ji, Muyao Ji, Lei Lai, Lei Lai, Ming Xia, Ming Xia, } "Research on the influence of baffle in luminous flux measurement with integrating sphere", Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104600X (24 October 2017); doi: 10.1117/12.2284390; https://doi.org/10.1117/12.2284390

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