24 October 2017 Research on characteristics measurement of infrared defect tester
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Proceedings Volume 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics; 104601F (2017) https://doi.org/10.1117/12.2285194
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ke-jia Zhang, Ke-jia Zhang, Bi-feng Zhang, Bi-feng Zhang, Li-min Xiong, Li-min Xiong, Tao-geng Zhou, Tao-geng Zhou, Jun-chao Zhang, Jun-chao Zhang, Hai-feng Meng, Hai-feng Meng, Chuan Cai, Chuan Cai, Ying-wei He, Ying-wei He, Xiao-hui Li, Xiao-hui Li, Chang-shi Wang, Chang-shi Wang, } "Research on characteristics measurement of infrared defect tester", Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104601F (24 October 2017); doi: 10.1117/12.2285194; https://doi.org/10.1117/12.2285194

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