24 October 2017 Defect analysis and detection of micro nano structured optical thin film
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Proceedings Volume 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics; 104601S (2017) https://doi.org/10.1117/12.2285625
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
This paper focuses on developing an automated method for detecting defects on our wavelength conversion thin film. We analyzes the operating principle of our wavelength conversion Micro/Nano thin film which absorbing visible light and emitting infrared radiation, indicates the relationship between the pixel’s pattern and the radiation of the thin film, and issues the principle of defining blind pixels and their categories due to the calculated and experimental results. An effective method is issued for the automated detection based on wavelet transform and template matching. The results reveal that this method has desired accuracy and processing speed.
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Chang Xu, Chang Xu, Nuo Shi, Nuo Shi, Lang Zhou, Lang Zhou, Qinfeng Shi, Qinfeng Shi, Yang Yang, Yang Yang, Zhuo Li, Zhuo Li, } "Defect analysis and detection of micro nano structured optical thin film", Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104601S (24 October 2017); doi: 10.1117/12.2285625; https://doi.org/10.1117/12.2285625
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