A colinear backscattering Mueller matrix microscope for reflection Muller matrix imaging

Zhenhua Chen; Yue Yao; Yuanhuan Zhu; Hui Ma

doi:10.1117/12.2289291

19 February 2018 A colinear backscattering Mueller matrix microscope for reflection Muller matrix imaging

Zhenhua Chen, Yue Yao, Yuanhuan Zhu, Hui Ma

Proceedings Volume 10489, Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis; 104890M (2018) https://doi.org/10.1117/12.2289291
Event: SPIE BiOS, 2018, San Francisco, California, United States

Abstract

In a recent attempt, we developed a colinear backscattering Mueller matrix microscope by adding polarization state generator (PSG) and polarization state analyzer (PSA) into the illumination and detection optical paths of a commercial metallurgical microscope. It is found that specific efforts have to be made to reduce the artifacts due to the intrinsic residual polarizations of the optical system, particularly the dichroism due to the 45 degrees beam splitter. In this paper, we present a new calibration method based on numerical reconstruction of the instrument matrix to remove the artifacts introduced by beam splitter. Preliminary tests using a mirror as a standard sample show that the maximum Muller matrix element error of the colinear backscattering Muller matrix microscope can be reduced to a few percent.

Conference Presentation

Citation Download Citation

Zhenhua Chen, Yue Yao, Yuanhuan Zhu, and Hui Ma "A colinear backscattering Mueller matrix microscope for reflection Muller matrix imaging", Proc. SPIE 10489, Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis, 104890M (19 February 2018); https://doi.org/10.1117/12.2289291

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