23 February 2018 Stimulated emission and spontaneous loss pump-probe microscopy for background removal
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Abstract
In this work, we have established a double modulation lock-in detection technique using two semiconductor laser diodes in stimulated emission based pump-probe microscopy. By modulating the pump and probe beams at two different frequencies, f1 and f2, the signal is then recovered with the sum frequency, (f1+ f2), so as to minimize the leak-through noise due to the spontaneous emission caused by the pump beam. In this way, the DC background that is often attributed to the stimulated emission is effectively removed. Our technique has implemented in ATTO647N fluorescent dye which is applicable for many biological applications.
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Subir Das, Subir Das, Bo-Wei Ho, Bo-Wei Ho, Fu-Jen Kao, Fu-Jen Kao, } "Stimulated emission and spontaneous loss pump-probe microscopy for background removal", Proc. SPIE 10498, Multiphoton Microscopy in the Biomedical Sciences XVIII, 104982C (23 February 2018); doi: 10.1117/12.2284396; https://doi.org/10.1117/12.2284396
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